SCANNED DOCUMENTS
Experts
- Chew Lim Tan
- C. V. Jawahar
- David S. Doermann
- Faisal Shafait
- Christian Reul
- Thomas M. Breuel
- Sekhar Mandal
- Mohamed Cheriet
- P. Nagabhushan
- Frank Puppe
- Syed Saqib Bukhari
- Bhabatosh Chanda
- Marcus Liwicki
- Christoph Wick
- Shijian Lu
- Basilios Gatos
- Gaofeng Meng
- Rafael Dueire Lins
- Jun Sun
- Gary E. Kopec
- Shamik Sural
- Rolf Ingold
- Soumyadeep Dey
- Dimosthenis Karatzas
- Utpal Garain
- Uwe Springmann
- Jean-Marc Ogier
- Chunhong Pan
- Nam Ik Cho
- Santanu Chaudhury
- Ching Y. Suen
- Dan S. Bloomberg
- Mita Nasipuri
- Satoshi Naoi
- Xiaoqing Ding
- S. P. Chowdhury
- Nibaran Das
- Venu Govindaraju
- Daniel P. Lopresti
Venues
- CoRR
- ICDAR
- Int. J. Document Anal. Recognit.
- ICPR
- DRR
- Pattern Recognit.
- ICIP
- Document Analysis Systems
- IEEE Access
- Multim. Tools Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- CVPR
- Document Recognition
- ICASSP
- Sensors
- DAS
- Pattern Recognit. Lett.
- J. Electronic Imaging
- ICPR (2)
- Document Recognition and Retrieval
- Int. J. Pattern Recognit. Artif. Intell.
- ACM Symposium on Document Engineering
- ICFHR
- MVA
- ACM Multimedia
- DHd
- ICMV
- MOCR@ICDAR
- SAC
- AAAI
- Pattern Anal. Appl.
- ICVGIP
- CVPR Workshops
- ICCV
- ICPR (3)
- DocEng
- HIP@ICDAR
- DIAL
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