SCAN STATISTIC
Experts
- Lajos Hanzo
- Xiang-Gen Xia
- Soon Xin Ng
- Hamid Jafarkhani
- Jean-Claude Belfiore
- Shinya Sugiura
- B. Sundar Rajan
- Georgios B. Giannakis
- Osamah Alamri
- Mohamed Oussama Damen
- Hsiao-feng Lu
- Mohammed El-Hajjar
- Camilla Hollanti
- Tuomas Virtanen
- Romain Serizel
- Genyuan Wang
- Sheng Chen
- Robert Schober
- Symeon Papadopoulos
- P. Vijay Kumar
- Arogyaswami Paulraj
- Nicolas Turpault
- Jingon Joung
- Frédérique E. Oggier
- Rodrigo C. de Lamare
- Are Hjørungnes
- Geert Leus
- Chintha Tellambura
- Thien Huu Nguyen
- Marvin K. Simon
- Babak Hassibi
- Tjeng Thiang Tjhung
- Roope Vehkalahti
- Yiannis Kompatsiaris
- Hongjun Xu
- Yindi Jing
- Chao Xu
- Chadi Abou-Rjeily
- G. Susinder Rajan
Venues
- CoRR
- ICASSP
- ICC
- GLOBECOM
- IEEE Trans. Wirel. Commun.
- IEEE Trans. Commun.
- IEEE Trans. Inf. Theory
- PIMRC
- IEEE Access
- WCNC
- IEEE Commun. Lett.
- IEEE Trans. Veh. Technol.
- ISIT
- IEEE Trans. Signal Process.
- Sensors
- EUSIPCO
- VTC Fall
- VTC Spring
- DCASE
- Int. J. Geogr. Inf. Sci.
- Wirel. Pers. Commun.
- INTERSPEECH
- Remote. Sens.
- TRECVID
- Signal Process.
- ITW
- IET Commun.
- IGARSS
- J. Comput. Phys.
- ICASSP (4)
- Symmetry
- MediaEval
- EMBC
- Multim. Tools Appl.
- EURASIP J. Adv. Signal Process.
- ISPRS Int. J. Geo Inf.
- IEEE Trans. Aerosp. Electron. Syst.
- ACM Multimedia
- KDD
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