SCALE SELECTION
Experts
- Tony Lindeberg
- Bart M. ter Haar Romeny
- Luc Florack
- Atsushi Imiya
- Max A. Viergever
- Tomoya Sakai
- Joachim Weickert
- J. Andrew Bangham
- Michael Felsberg
- Songde Ma
- Arjan Kuijper
- Alfons H. Salden
- Jan-Olof Eklundh
- Alan L. Yuille
- Jinhai Li
- Richard W. Harvey
- Marco Loog
- Jean-Michel Morel
- Fahad Shahbaz Khan
- Ali Shokoufandeh
- Mads Nielsen
- Christopher J. Taylor
- Kim Steenstrup Pedersen
- Jan J. Koenderink
- João Batista Florindo
- Alison Bosson
- Byung-Woo Hong
- Jon Sporring
- Andrea Vedaldi
- Frans Kanters
- Paul T. Jackway
- Subhransu Maji
- Iasonas Kokkinos
- Sung Ha Kang
- António M. G. Pinheiro
- Iris Vanhamel
- Hichem Sahli
- Ylva Jansson
- B. S. Manjunath
Venues
- CoRR
- Scale-Space
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- SSVM
- ICIP
- Pattern Recognit.
- J. Math. Imaging Vis.
- Pattern Recognit. Lett.
- ICPR
- IEEE Trans. Image Process.
- ICASSP
- Int. J. Comput. Vis.
- BMVC
- Image Vis. Comput.
- ICCV
- Neurocomputing
- ECCV (1)
- Remote. Sens.
- ISBI
- Int. J. Approx. Reason.
- J. Comput. Phys.
- Medical Imaging: Image Processing
- ICIP (1)
- Inf. Sci.
- EUSIPCO
- J. Vis. Commun. Image Represent.
- IGARSS
- Multim. Tools Appl.
- WACV
- EMBC
- IEEE Trans. Vis. Comput. Graph.
- CVPR (1)
- Comput. Vis. Image Underst.
- IEEE Signal Process. Lett.
- INTERSPEECH
- MVA
- MICCAI (1)
- Signal Process.
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