SATISFIABILITY TESTING
Experts
- Pierre Marquis
- Shaowei Cai
- Bart Selman
- Moshe Y. Vardi
- Kuldeep S. Meel
- Stefan Szeider
- Chu Min Li
- Philippe Codognet
- Yang Xu
- Allen Van Gelder
- Alejandro Arbelaez
- John Thornton
- Guy Van den Broeck
- Ashish Sabharwal
- Shaowei Cai
- Yuefei Sui
- Kaile Su
- Jérôme Lang
- Peter J. Stuckey
- Angelika Kimmig
- Camillo Fiorentini
- Abdul Sattar
- Paul Beame
- Christian J. Muise
- Mauricio G. C. Resende
- Armin Biere
- Antti Kuusisto
- Henry A. Kautz
- Duc Nghia Pham
- Luciano Serafini
- Johannes Klaus Fichte
- Sanjit A. Seshia
- Markus Hecher
- Holger H. Hoos
- Jun Gu
- Stefan Woltran
- Lukas Kroc
- Lakhdar Sais
- Edward A. Hirsch
Venues
- CoRR
- SAT
- AAAI
- IJCAI
- Notre Dame J. Formal Log.
- Theor. Comput. Sci.
- Stud Logica
- J. Log. Comput.
- Artif. Intell.
- J. Symb. Log.
- Math. Log. Q.
- Electron. Colloquium Comput. Complex.
- Log. J. IGPL
- J. Autom. Reason.
- CP
- TABLEAUX
- ICTAI
- Ann. Pure Appl. Log.
- ACM Trans. Comput. Log.
- Arch. Math. Log.
- KR
- J. Heuristics
- Ann. Math. Artif. Intell.
- J. Philos. Log.
- Inf. Process. Lett.
- ECAI
- CADE
- DATE
- MFCS
- LICS
- GECCO
- CSL
- Australian Conference on Artificial Intelligence
- AAAI/IAAI
- Constraints An Int. J.
- Discret. Appl. Math.
- AAMAS
- 计算机科学
- Inf. Comput.
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