SALIENCY MEASURE
Experts
- Ronen Basri
- Linwei Ye
- Maria Montanucci
- Alexandre Rok
- T. D. Alter
- Giovanni Zini
- Bartosz Walczak
- Zhi Liu
- Massimo Giulietti
- Joachim S. Stahl
- Paul L. Rosin
- Wei Yan
- Youqiang Hou
- Takashi Shinomiya
- Nuno Vasconcelos
- Lina Li
- Gábor Korchmáros
- Su Li
- Kotaro Uchida
- Feng Zhou
- Gang Huang
- Xavier Otazu
- Jae-Young Sim
- Gunther Heidemann
- Tat-Jen Cham
- Nian Liu
- Giuseppe Serra
- Michael A. Lachance
- Fernando Torres
- Zhe Sun
- Ge Li
- Mi-Suen Lee
- Amir Tamrakar
- C. Alejandro Párraga
- Wolfgang Maass
- Michael Lindenbaum
- Jeffrey Mark Siskind
- Yuanyuan Wang
- Ran Song
Venues
- Finite Fields Their Appl.
- CoRR
- IEEE Signal Process. Lett.
- CVPR
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- MVA
- VISAPP (2)
- Int. J. Comput. Vis.
- Expert Syst. J. Knowl. Eng.
- Discret. Comput. Geom.
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Image Process.
- IEEE Access
- Image Vis. Comput.
- SoCG
- ECCV (2)
- Electron. Colloquium Comput. Complex.
- ICPR (4)
- IICAI
- ICCV Workshops
- IEEE Trans. Broadcast.
- NIPS
- Multim. Tools Appl.
- ECCV (1)
- Signal Process. Image Commun.
- Ubiquity
- Neurocomputing
- J. Approx. Theory
- ICCVE
- APSIPA
- VISIGRAPP (4: VISAPP)
- ICPR
- WAPCV
- IC-AI
- Comput. Vis. Image Underst.
- MUE
- CVPR Workshops
- J. Inform. and Commun. Convergence Engineering
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