SALIENCY MEASURE
Experts
- Maria Montanucci
- Giovanni Zini
- Zhi Liu
- Alexandre Rok
- Bartosz Walczak
- Massimo Giulietti
- Ronen Basri
- T. D. Alter
- Linwei Ye
- Youqiang Hou
- Minoru Nakayama
- C. Alejandro Párraga
- Michal Haindl
- Wei Zhang
- Ling Shao
- Seong-Ho Park
- Junwei Han
- Jiande Sun
- Hayato Teranaka
- Matteo Bonini
- Lucas Paletta
- Liquan Shen
- Rui Huang
- Gábor Korchmáros
- Massimiliano Sala
- Tat-Jen Cham
- Mi-Suen Lee
- Rita Cucchiara
- Kotaro Uchida
- Su Li
- Feng Zhou
- Irene Cheng
- Hyeyoung Park
- Jeffrey Mark Siskind
- Chunbiao Zhu
- Toshiro Kubota
- Hyoungseop Kim
- Paul L. Rosin
- Yitian Zhao
Venues
- Finite Fields Their Appl.
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Signal Process. Lett.
- MVA
- CVPR
- VISAPP (2)
- ICCV
- Signal Process. Image Commun.
- NIPS
- IICAI
- J. Approx. Theory
- Expert Syst. J. Knowl. Eng.
- Electron. Colloquium Comput. Complex.
- ICPR
- J. Electronic Imaging
- Multim. Tools Appl.
- CVPR Workshops
- ICPR (4)
- CAD/Graphics
- ICIMCS
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Access
- Neurocomputing
- Int. J. Comput. Vis.
- ECCV (1)
- MUE
- Image Vis. Comput.
- J. Inform. and Commun. Convergence Engineering
- VISIGRAPP (4: VISAPP)
- Comput. Vis. Image Underst.
- IC-AI
- IEEE Trans. Image Process.
- SoCG
- IEEE Trans. Broadcast.
- ICCVE
- Ubiquity
- Discret. Comput. Geom.
- WAPCV
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend