RIEMANNIAN METRIC
Experts
- Anuj Srivastava
- P. Thomas Fletcher
- Shun-ichi Amari
- Baba C. Vemuri
- Salem Said
- Lionel Bombrun
- Xavier Pennec
- Nicholas Ayache
- Eric Klassen
- Vincent Arsigny
- Xianfeng Gu
- Martin Bauer
- Yannick Berthoumieu
- Michael M. Bronstein
- Paul M. Thompson
- Luc Florack
- Laurent D. Cohen
- Peihua Li
- Ying He
- Alexey Mashtakov
- Pierre Fillard
- Andrea Fuster
- Remco Duits
- Tatsuaki Wada
- Ioana Ilea
- Pierre-Antoine Absil
- Sebastian Kurtek
- Dinggang Shen
- Carl-Fredrik Westin
- Mehrtash Tafazzoli Harandi
- Mathieu Salzmann
- Sarang C. Joshi
- Marco Congedo
- Maher Moakher
- Erik J. Bekkers
- Laura Astola
- Anastasios N. Venetsanopoulos
- Martin Rumpf
- Anthony J. Yezzi
Venues
- CoRR
- GSI
- ISBI
- Entropy
- MICCAI (1)
- IEEE Trans. Vis. Comput. Graph.
- NeuroImage
- IEEE Trans. Signal Process.
- ICCV
- ICASSP
- J. Multivar. Anal.
- CVPR
- SIAM J. Imaging Sci.
- IPMI
- J. Math. Imaging Vis.
- IEEE Trans. Medical Imaging
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR Workshops
- Comput. Graph. Forum
- Pattern Recognit.
- SIAM J. Matrix Anal. Appl.
- Medical Imaging: Image Processing
- IEEE Visualization
- Comput. Aided Des.
- NeurIPS
- ICIP
- SIAM J. Math. Anal.
- Int. J. Comput. Vis.
- Appl. Math. Comput.
- ICML
- Exp. Math.
- Int. J. Math. Math. Sci.
- Comput. Aided Geom. Des.
- ICCV Workshops
- SIAM J. Control. Optim.
- Symmetry
- MICCAI (2)
- ACM Trans. Graph.
- J. Comput. Appl. Math.
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