REFLECTANCE FUNCTION
Experts
- Paul E. Debevec
- Shawn Hempel
- Imari Sato
- Jan Meseth
- Shinji Ozawa
- Pieter Peers
- Kazuko Omata
- Graham Fyffe
- Hideo Saito
- Paul Carroll
- Andrea Weidlich
- Lynn Fyffe
- Craig Miller
- Yoichi Sato
- Narendra Ahuja
- Lawrence B. Wolff
- Koichiro Deguchi
- Zihan Wang
- Takafumi Iwaguchi
- Xi Wang
- Ondrej Drbohlav
- Yuji Iwahori
- Tianli Yu
- Carme Julià
- Rui Xia
- Tejas Madan Tanksale
- Feng Lu
- Todd A. Mancini
- Bill Ambrisco
- Shoichiro Yamaguchi
- Felipe Lumbreras
- Takayuki Okatani
- Alexander Plopski
- Yue Ni
- Hossein Ragheb
- Haruo Takemura
- Ming Jun Ren
- Hiroyuki Kamei
- James J. Little
Venues
- ICCV
- CVPR
- Comput. Vis. Image Underst.
- ICIAR
- SIGGRAPH Talks
- ECCV Workshops (2)
- Image Vis. Comput.
- 3DPVT
- WACV
- SIGGRAPH Posters
- Int. J. Comput. Vis.
- Measuring, Modeling, and Reproducing Material Appearance
- 3DIM
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Image Process.
- J. Comput. Civ. Eng.
- Rendering Techniques
- Systems and Computers in Japan
- VR
- CVPR (2)
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
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