RASTER SCAN
Experts
- Costantino Grana
- Sei-ichiro Kamata
- Federico Bolelli
- Lifeng He
- Yuyan Chao
- Kenji Suzuki
- Eugenio Culurciello
- Keiichiro Kagawa
- Jian Zhang
- Lorenzo Baraldi
- David Stoppa
- Stefano Allegretti
- Keita Yasutomi
- Wei Tang
- Matteo Perenzoni
- Shoushun Chen
- David A. Bader
- Shoji Kawahito
- Lionel Lacassagne
- Min-Woong Seo
- Xiao Zhao
- Murray H. Loew
- Giuseppe F. Italiano
- Danny Crookes
- Jin Murayama
- Joseph F. JáJá
- Zhexuan Song
- S. M. A. Sharif
- C. Jinshong Hwang
- Ankit Agrawal
- Loukas Georgiadis
- Jinha Lee
- Toon Goedemé
- Michael A. Kriss
- Soumen Bag
- Siddharth Gupta
- Daniele Borghesani
- S. Sukhsawas
- Takeshi Naemura
Venues
- CoRR
- Sensors
- ICPR
- ISCAS
- IEEE J. Solid State Circuits
- ISSCC
- SIGGRAPH
- ICIP (1)
- IEEE Trans. Image Process.
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Pattern Recognit.
- IEICE Electron. Express
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- AIPR
- IEEE Trans. Circuits Syst. Video Technol.
- J. Signal Process. Syst.
- ICCE
- ISPA
- Imaging Sensors and Systems
- J. Real Time Image Process.
- IEEE BigData
- Comput. Graph.
- Inf. Sci.
- ICECS
- Systems and Computers in Japan
- IPTA
- ESSCIRC
- IEICE Trans. Electron.
- ITCC
- PICS
- Digital Photography
- ICIP
- IGARSS
- IEEE Trans. Biomed. Eng.
- Random Struct. Algorithms
- ICCR
- WAW
- J. Bioinform. Comput. Biol.
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