POINT LIGHT SOURCE
Experts
- Roberto Mecca
- Dimitris Samaras
- Yasuyuki Matsushita
- Katsushi Ikeuchi
- Pieter Peers
- Paul E. Debevec
- Takahiro Okabe
- Edwin R. Hancock
- Ko Nishino
- Roberto Cipolla
- Ravi Ramamoorthi
- Yvain Quéau
- Imari Sato
- Yuji Iwahori
- Jean-Denis Durou
- Alfred M. Bruckstein
- Takayuki Okatani
- Takashi Matsuyama
- Koichiro Deguchi
- Jonathan T. Barron
- Yoichi Sato
- Philip L. Worthington
- Fotios Logothetis
- Osamu Ikeda
- Daniel Cremers
- Ham M. Rara
- Ron Kimmel
- William A. P. Smith
- Maria Petrou
- Michael Breuß
- Melvyn L. Smith
- David J. Kriegman
- Salma Jiddi
- Lei Zhang
- Aly A. Farag
- Ryszard Kozera
- Fredric Solomon
- Philippe Robert
- Abhijeet Ghosh
Venues
- CVPR
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- BMVC
- Int. J. Comput. Vis.
- ICIP
- Comput. Vis. Image Underst.
- Comput. Graph. Forum
- ICPR
- ACM Trans. Graph.
- 3DV
- Systems and Computers in Japan
- Image Vis. Comput.
- IEICE Electron. Express
- SIGGRAPH Posters
- MVA
- Pattern Recognit.
- IEEE Trans. Image Process.
- IEEE Trans. Vis. Comput. Graph.
- ECCV (1)
- CVPR (1)
- WACV
- Rendering Techniques
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Remote. Sens.
- Displays
- Sensors
- CIC
- Comput. Graph.
- ECCV (2)
- Color Imaging Conference
- OFC
- ECCV (3)
- EUSIPCO
- SIAM J. Imaging Sci.
- Multim. Tools Appl.
- ICCVG
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