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Experts
- Chew Lim Tan
- David S. Doermann
- Tony Owen
- C. V. Jawahar
- Sekhar Mandal
- Bhabatosh Chanda
- Yue Lu
- Mohamed Cheriet
- Gaofeng Meng
- Soumyadeep Dey
- P. Nagabhushan
- Shijian Lu
- Chunhong Pan
- Gary E. Kopec
- Faisal Shafait
- Syed Saqib Bukhari
- Thomas M. Breuel
- Jean-Marc Ogier
- S. P. Chowdhury
- Iain D. Craig
- Umapada Pal
- Rafael Dueire Lins
- Nikos Papamarkos
- Venu Govindaraju
- Basilios Gatos
- Mita Nasipuri
- Seiichi Uchida
- Reza Farrahi Moghaddam
- Marcus Liwicki
- Shiming Xiang
- Ajoy Mondal
- Nibaran Das
- Ergina Kavallieratou
- Su S. Chen
- Nam Ik Cho
- B. B. Chaudhuri
- Santanu Chaudhury
- Jun Sun
- Hyung Il Koo
Venues
- ICDAR
- CoRR
- Robotica
- Int. J. Document Anal. Recognit.
- ICPR
- Document Analysis Systems
- IEEE Commun. Mag.
- DRR
- ICIP
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACM Symposium on Document Engineering
- Document Recognition
- Artif. Life
- Nat. Lang. Eng.
- IEEE Trans. Image Process.
- Multim. Tools Appl.
- SIGACT News
- Comput. J.
- Pattern Recognit. Lett.
- DAS
- SAC
- ICASSP
- J. Electronic Imaging
- SIGIR
- CVPR Workshops
- ICPR (2)
- Cryptologia
- ICMV
- DocEng
- Int. J. Pattern Recognit. Artif. Intell.
- ICFHR
- ICVGIP
- WWW
- CVPR
- IEEE Access
- DIAL
- MVA
- IPCV
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