ORDINAL MEASURES
Experts
- Zhenan Sun
- Tieniu Tan
- Patrick J. Flynn
- Dinkar N. Bhat
- Shree K. Nayar
- Ran He
- James F. Peters
- Gareth Howells
- Hengshuang Zhao
- Vahid Mirjalili
- Arun Ross
- Mateusz Trokielewicz
- Kevin W. Bowyer
- Yang Hu
- Konstantinos Sirlantzis
- Xiaogang Xu
- Sudipta Banerjee
- Zhenhua Chai
- Adam Czajka
- Yixing Lao
- Daniel Moreira
- Zhipeng Cai
- Xihui Liu
- Yillbyung Lee
- Joseph M. Burdis
- Xianquan Zhang
- Axel Pinz
- Chiara Galdi
- Luis Galarza
- Sören Petersen
- Abhijit S. Ogale
- Xiaochun Cao
- Chun-Wei Tan
- Hong Yan
- Berk Sevilmis
- Zhenhai Chen
- Stefan Scherer
- Jean-Luc Dugelay
- Shakuntala Mangru
Venues
- IEEE Trans. Inf. Forensics Secur.
- CoRR
- CVPR
- ICIP
- ACM Multimedia
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Bio Inspired Comput.
- BTAS
- Int. J. Pattern Recognit. Artif. Intell.
- WACV
- Proc. IEEE
- IEEE Trans. Circuits Syst. Video Technol.
- BMVC
- 3DPVT
- ISCSCT (2)
- ECCV Workshop BioAW
- SCG
- CCBR
- Pattern Recognit.
- CIARP
- CIB
- ICPR (3)
- Secur. Commun. Networks
- CAIP
- ICIP (2)
- ICB
- ICASSP
- ECCV (3)
- Applications of Invariance in Computer Vision
- ICCV
- NeurIPS
- ISBA
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