NOISY PIXELS
Experts
- Etienne E. Kerre
- Mike Nachtegael
- Stefan Schulte
- Hong Ren Wu
- Vladimir S. Crnojevic
- Ayyaz Hussain
- Dietrich Van der Weken
- Valérie De Witte
- Samuel Morillas
- Tae-Sun Choi
- Valentín Gregori
- M. Emin Yüksel
- Francisco J. Gallegos Funes
- Igor Djurovic
- Farokh Marvasti
- Hossein Hosseini
- Tom Mélange
- Bin Qiu
- Sohail Masood Bhatti
- Mila Nikolova
- M. Arfan Jaffar
- Vladimir V. Lukin
- Raghav Dev
- Jorge D. Mendiola-Santibañez
- Pierre Duhamel
- Iván R. Terol-Villalobos
- Yinwei Zhan
- Umesh Ghanekar
- Chin-Hsing Chen
- Chin-Yuan Hsu
- Ping Guo
- Yong-Hong Tan
- Sos S. Agaian
- Licheng Liu
- Noriaki Suetake
- Nikolay N. Ponomarenko
- Hitoshi Kiya
- Ridha Hamila
- Chen Hu
Venues
- IEEE Signal Process. Lett.
- Multim. Tools Appl.
- Signal Image Video Process.
- IEEE Trans. Image Process.
- CoRR
- Signal Process.
- ICASSP
- IET Image Process.
- IEEE Trans. Commun.
- IEEE Access
- FUZZ-IEEE
- ICIP (1)
- J. Math. Imaging Vis.
- EURASIP J. Image Video Process.
- EURASIP J. Adv. Signal Process.
- Pattern Recognit. Lett.
- IJCNN
- J. Vis. Commun. Image Represent.
- J. Electronic Imaging
- ICECS
- Neurocomputing
- ISCAS
- ISIT
- SIGMAP
- Sensors
- Fuzzy Sets Syst.
- EUSIPCO
- SIAM J. Imaging Sci.
- ACIVS
- ICASSP (4)
- ICIP
- PIMRC
- Digital Photography
- Expert Syst. Appl.
- Real Time Imaging
- ICACCI
- IEICE Trans. Inf. Syst.
- WHISPERS
- IPCCC
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