NOISE MODEL
Experts
- H. Vincent Poor
- Alex Dytso
- Mohamed-Slim Alouini
- Norman C. Beaulieu
- Zouheir Rezki
- Jun Lin
- David T. Blaauw
- Emanuele Viterbo
- Baoming Bai
- Warren J. Gross
- Xiao Ma
- Yonina C. Eldar
- David Declercq
- Sen M. Kuo
- Shlomo Shamai
- Muriel Médard
- Laszlo B. Kish
- Zhongfeng Wang
- Yannis Stylianou
- Julian Cheng
- Marc P. C. Fossorier
- Seyyed Ali Hashemi
- Jinhong Yuan
- Bane V. Vasic
- Lajos Hanzo
- Eby G. Friedman
- Zhiyuan Yan
- Antonia Wachter-Zeh
- John M. Cioffi
- Akihiko Sugiyama
- Wenyi Zhang
- Alexios Balatsoukas-Stimming
- Stephan ten Brink
- Jean-Michel Morel
- Henry D. Pfister
- Naofal Al-Dhahir
- Amos Lapidoth
- Amir H. Banihashemi
- Tongliang Liu
Venues
- CoRR
- ICASSP
- IEEE Trans. Inf. Theory
- IEEE Trans. Commun.
- IEEE Access
- ISIT
- IEEE Trans. Signal Process.
- ISCAS
- IEEE Commun. Lett.
- Sensors
- INTERSPEECH
- EUSIPCO
- Signal Process.
- IEEE Trans. Instrum. Meas.
- IEEE Signal Process. Lett.
- IEEE J. Solid State Circuits
- ICC
- IEEE Trans. Circuits Syst. I Regul. Pap.
- GLOBECOM
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- ICIP
- IEEE Trans. Circuits Syst. II Express Briefs
- ICECS
- IEEE Trans. Image Process.
- PIMRC
- IEEE Trans. Veh. Technol.
- IEEE Trans. Geosci. Remote. Sens.
- OFC
- CICC
- IEEE Trans. Speech Audio Process.
- Neurocomputing
- IET Commun.
- Digit. Signal Process.
- EMBC
- IEEE Trans. Wirel. Commun.
- Entropy
- Microelectron. J.
- IEEE Trans. Aerosp. Electron. Syst.
- Wirel. Pers. Commun.
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