MULTI LABEL CLASSIFICATION
Experts
- Min-Ling Zhang
- Grigorios Tsoumakas
- Zhi-Hua Zhou
- Eneldo Loza Mencía
- Eyke Hüllermeier
- Jianhua Xu
- Johannes Fürnkranz
- Dacheng Tao
- Sebastián Ventura
- Xin Geng
- Jinghua Liu
- Philip S. Yu
- Victor S. Sheng
- Guoxian Yu
- Yaojin Lin
- Jesse Read
- Alex Alves Freitas
- Shuicheng Yan
- Tianshui Chen
- Carlotta Domeniconi
- Saso Dzeroski
- Xiangliang Zhang
- Yuhong Guo
- Michael Rapp
- Liang Lin
- Wanfu Gao
- Hsuan-Tien Lin
- Rohit Babbar
- Qinghua Hu
- Xiangnan Kong
- Duoqian Miao
- Tat-Seng Chua
- Maria Carolina Monard
- Dae-Won Kim
- Jun Huang
- Ricardo Cerri
- Songhe Feng
- Jun Wang
- Chongjun Wang
Venues
- CoRR
- IEEE Access
- Neurocomputing
- AAAI
- Pattern Recognit.
- CVPR
- Knowl. Based Syst.
- IJCNN
- Inf. Sci.
- ICASSP
- Expert Syst. Appl.
- Appl. Intell.
- IJCAI
- Neural Comput. Appl.
- CLEF (Working Notes)
- ACM Multimedia
- Multim. Tools Appl.
- Pattern Recognit. Lett.
- IEEE Trans. Knowl. Data Eng.
- KDD
- ICML
- ICIP
- ICCV
- CIKM
- IEEE Trans. Multim.
- ICPR
- ICME
- ICDM
- Appl. Soft Comput.
- IEEE Trans. Image Process.
- NIPS
- IEEE Trans. Neural Networks Learn. Syst.
- Int. J. Mach. Learn. Cybern.
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- Mach. Learn.
- Sensors
- NeurIPS
- Remote. Sens.
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