LOWER ERROR RATES
Experts
- Norman C. Beaulieu
- Julian Cheng
- Jingqing Wang
- H. Vincent Poor
- Mohamed-Slim Alouini
- Xi Zhang
- Charles H.-P. Wen
- Murat Uysal
- Masanori Hashimoto
- Cheng-Fu Huang
- Yi-Kuei Lin
- Hossein Asadi
- Mohsen Raji
- Melvin A. Breuer
- Mahmoud H. Ismail
- Mehdi Baradaran Tahoori
- Behnam Ghavami
- Sheng Chen
- Lajos Hanzo
- Sami Muhaidat
- Andreas Burg
- Alexios Balatsoukas-Stimming
- Seyed Ghassem Miremadi
- Stevan M. Berber
- Hong-Chuan Yang
- Hua Yu
- Takao Onoye
- Orion Afisiadis
- Hoojin Lee
- Fangjiong Chen
- Shideh Shahidi
- Nikos C. Sagias
- Emre Aktas
- Ali Özgür Yilmaz
- Are Hjørungnes
- Hiroshi Harada
- Mustafa M. Matalgah
- Yung-Chih Chen
- Matthieu Cotting
Venues
- IEEE Trans. Commun.
- CoRR
- IEEE Commun. Lett.
- GLOBECOM
- ICC
- WCNC
- PIMRC
- IEICE Trans. Commun.
- IEEE Trans. Wirel. Commun.
- Wirel. Pers. Commun.
- IEEE Trans. Inf. Theory
- VTC Spring
- IEEE Trans. Veh. Technol.
- ISIT
- ICASSP
- IEEE J. Sel. Areas Commun.
- IET Commun.
- DATE
- IRPS
- IEEE Access
- IEEE Trans. Signal Process.
- Pattern Recognit. Lett.
- Phys. Commun.
- DAC
- Microelectron. Reliab.
- ICCAD
- CISS
- ITC
- IOLTS
- ASP-DAC
- INTERSPEECH
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- VTC Fall
- ISQED
- DFT
- Int. J. Commun. Syst.
- ISWCS
- IEEE J. Solid State Circuits
- J. Electron. Test.
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