IRIS TEXTURE
Experts
- Adam Czajka
- Kevin W. Bowyer
- Mateusz Trokielewicz
- Zhenan Sun
- Piotr Maciejewicz
- Andreas Uhl
- Arun Ross
- Patrick J. Flynn
- Tieniu Tan
- Hugo Proença
- Kang Ryoung Park
- Kaushik Roy
- Prabir Bhattacharya
- Jaihie Kim
- Zhaofeng He
- Christian Rathgeb
- Nicolaie Popescu-Bodorin
- Daniel Moreira
- Mayank Vatsa
- Richa Singh
- John Daugman
- Gareth Howells
- Mahmut Karakaya
- Fernando Alonso-Fernandez
- Bernadette Dorizzi
- Konstantinos Sirlantzis
- Byungjun Son
- Jing Liu
- Soumyadip Rakshit
- Banshidhar Majhi
- Peter Wild
- Pengfei Shi
- Luis E. Garza-Castañón
- James R. Matey
- Byung Jun Kang
- Sonia Garcia-Salicetti
- Man Zhang
- Wen-Shiung Chen
- Babak Nadjar Araabi
Venues
- CoRR
- ICB
- BTAS
- IEEE Trans. Inf. Forensics Secur.
- Pattern Recognit. Lett.
- IJCB
- ICPR
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Image Vis. Comput.
- IEEE Access
- CCBR
- Pattern Recognit.
- WACV
- IEEE Trans. Syst. Man Cybern. Part B
- J. Electronic Imaging
- CVPR Workshops
- Scand. J. Inf. Syst.
- BIOSIG
- Multim. Tools Appl.
- ISBA
- IWBF
- CIB
- Comput. Vis. Image Underst.
- Int. J. Pattern Recognit. Artif. Intell.
- BIOSIGNALS
- Expert Syst. Appl.
- AVBPA
- ICPR (4)
- CIARP
- Int. J. Biom.
- IET Biom.
- ACPR
- ISVC (1)
- EST
- TREC
- Signal Image Video Process.
- Pattern Anal. Appl.
- Sensors
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