IRIS BIOMETRICS
Experts
- Christoph Busch
- Kevin W. Bowyer
- Adam Czajka
- Zhenan Sun
- Tieniu Tan
- Arun Ross
- Andreas Uhl
- Mateusz Trokielewicz
- Hugo Proença
- Fernando Alonso-Fernandez
- Christian Rathgeb
- Kiran B. Raja
- Patrick J. Flynn
- Josef Bigün
- Ramachandra Raghavendra
- Richa Singh
- Piotr Maciejewicz
- Mayank Vatsa
- Kang Ryoung Park
- Banshidhar Majhi
- Juan E. Tapia
- Prabir Bhattacharya
- Ajay Kumar
- Kaushik Roy
- Michele Nappi
- Hunny Mehrotra
- Marios Savvides
- Zhaofeng He
- Mahmut Karakaya
- Bernadette Dorizzi
- Damon L. Woodard
- Peter Wild
- Naser Damer
- Julian Fiérrez
- David Menotti
- Kien Nguyen Thanh
- Daniel Riccio
- Sridha Sridharan
- Maria De Marsico
Venues
- CoRR
- ICB
- IEEE Trans. Inf. Forensics Secur.
- BTAS
- Pattern Recognit. Lett.
- ICPR
- ICIP
- IJCB
- Multim. Tools Appl.
- CVPR Workshops
- IEEE Access
- Int. J. Biom.
- BIOSIG
- IET Biom.
- Image Vis. Comput.
- Pattern Recognit.
- Sensors
- WACV
- CCBR
- EUSIPCO
- IWBF
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Electronic Imaging
- Expert Syst. Appl.
- BIOSIGNALS
- Comput. Secur.
- Comput. Vis. Image Underst.
- SITIS
- Scand. J. Inf. Syst.
- AVBPA
- Signal Image Video Process.
- CIB
- Computer
- CIBIM
- ISBA
- ICDP
- Pattern Anal. Appl.
- ICASSP
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