INTERNATIONAL STANDARD
Experts
- Mario Piattini
- Rory V. O'Connor
- Claude Y. Laporte
- Jingde Cheng
- Touradj Ebrahimi
- Ricardo Colomo Palacios
- Mirna Muñoz
- Moisés Rodríguez
- Mary-Luz Sánchez-Gordón
- Ho-Won Jung
- Yuichi Goto
- Maria Teresa Baldassarre
- Antònia Mas Picahaco
- Francisco J. Pino
- Knut Blind
- Fernando Pereira
- Adriana Peña
- Witold Suryn
- Laurent Romary
- Khaled El Emam
- Ismael Caballero
- Fritz Stallinger
- Leonardo Chiariglione
- Gloria Piedad Gasca Hurtado
- Jezreel Mejia
- Gary S. Robinson
- Marius Preda
- Thomas Richter
- Antoni Lluís Mesquida
- Paulo Leitão
- Coral Calero
- Kyoungro Yoon
- Javier Verdugo
- Abraham Dávila
- Charilaos A. Christopoulos
- Shoichi Morimoto
- Stamatis Karnouskos
- Thomas I. Strasser
- Daniel T. Lee
Venues
- CoRR
- Comput. Stand. Interfaces
- EuroSPI
- IEEE Commun. Mag.
- Computer
- IEEE Trans. Instrum. Meas.
- SPICE
- IEEE Commun. Stand. Mag.
- SIIT
- IEEE Signal Process. Mag.
- RFC
- IACR Cryptol. ePrint Arch.
- IEEE Micro
- ACM Stand.
- ACM SIGCHI Bull.
- Commun. ACM
- Datenschutz und Datensicherheit
- Signal Process. Image Commun.
- IEEE Multim.
- Int. J. IT Stand. Stand. Res.
- IEEE Access
- Proc. IEEE
- IEEE Robotics Autom. Mag.
- ICIP
- MedInfo
- Int. J. Inf. Technol. Syst. Approach
- ISCAS
- J. ICT Stand.
- Softw. Process. Improv. Pract.
- IEEE Trans. Engineering Management
- IEEE Veh. Technol. Mag.
- IECON
- SSR
- Comput. Secur.
- Scientometrics
- Softw. Qual. J.
- LREC
- J. Softw. Evol. Process.
- IEEE Consumer Electron. Mag.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend