IMAGING CONDITIONS
Experts
- Tien-Tsin Wong
- Paul E. Debevec
- Sven Loncaric
- Nikola Banic
- Abhijeet Ghosh
- Pieter Peers
- Reinhard Klette
- Katsushi Ikeuchi
- Chi-Sing Leung
- Qiang Ji
- Brian V. Funt
- Yoichi Sato
- Carsten Dachsbacher
- Jorge Urrutia
- Ramesh Raskar
- Philippe Bekaert
- Shree K. Nayar
- Imari Sato
- Jeff B. Pelz
- Theo Gevers
- Daijin Kim
- Aly A. Farag
- Shuo Chen
- Timo Ropinski
- Simon Labouesse
- Jan Kautz
- Srinivasa G. Narasimhan
- Jérôme Idier
- Matthew A. Turk
- Tze-Yui Ho
- Peter N. Belhumeur
- Anselm Grundhöfer
- Marc Allain
- Tobias Ritschel
- Graham D. Finlayson
- Thorsten Grosch
- M. Salman Asif
- Reiner Lenz
- Donald P. Greenberg
Venues
- CoRR
- ICIP
- CVPR
- Sensors
- Comput. Graph. Forum
- IEEE Access
- Multim. Tools Appl.
- ICPR
- ICCV
- Color Imaging Conference
- IEEE Trans. Image Process.
- Pattern Recognit.
- ACM Trans. Graph.
- Pattern Recognit. Lett.
- Rendering Techniques
- Comput. Vis. Image Underst.
- Comput. Electron. Agric.
- EMBC
- J. Vis. Commun. Image Represent.
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Comput. Vis.
- CIC
- Remote. Sens.
- IEEE Trans. Vis. Comput. Graph.
- J. Electronic Imaging
- CGIV
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Consumer Electron.
- Vis. Comput.
- SIGGRAPH Sketches
- ICME
- EUSIPCO
- ICASSP
- SIGGRAPH Posters
- Image Vis. Comput.
- BMVC
- DAGM-Symposium
- Comput. Graph.
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