IMAGING CONDITIONS
Experts
- Tien-Tsin Wong
- Paul E. Debevec
- Sven Loncaric
- Nikola Banic
- Abhijeet Ghosh
- Katsushi Ikeuchi
- Reinhard Klette
- Pieter Peers
- Chi-Sing Leung
- Qiang Ji
- Brian V. Funt
- Yoichi Sato
- Shree K. Nayar
- Carsten Dachsbacher
- Ramesh Raskar
- Jorge Urrutia
- Philippe Bekaert
- Donald P. Greenberg
- Alexei A. Efros
- Thorsten Grosch
- Jeff B. Pelz
- Jérôme Idier
- Pheng-Ann Heng
- Tze-Yui Ho
- Allen Y. Yang
- Reiner Lenz
- Simon Labouesse
- Peter N. Belhumeur
- Daijin Kim
- Graham D. Finlayson
- Imari Sato
- Kavita Bala
- Chengjun Liu
- Aly A. Farag
- M. Salman Asif
- Theo Gevers
- Jan Kautz
- Shuo Chen
- Timo Ropinski
Venues
- CoRR
- ICIP
- CVPR
- Sensors
- Comput. Graph. Forum
- IEEE Access
- Multim. Tools Appl.
- ICPR
- ICCV
- Color Imaging Conference
- IEEE Trans. Image Process.
- Pattern Recognit.
- Rendering Techniques
- ACM Trans. Graph.
- Pattern Recognit. Lett.
- Comput. Electron. Agric.
- EMBC
- Comput. Vis. Image Underst.
- J. Vis. Commun. Image Represent.
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Pattern Recognit. Artif. Intell.
- CIC
- IEEE Trans. Pattern Anal. Mach. Intell.
- CGIV
- Int. J. Comput. Vis.
- IEEE Trans. Vis. Comput. Graph.
- J. Electronic Imaging
- Remote. Sens.
- MVA
- SIGGRAPH Posters
- Comput. Graph.
- SIGGRAPH Sketches
- Image Vis. Comput.
- ICME
- DAGM-Symposium
- BMVC
- IEEE Signal Process. Lett.
- IEEE Trans. Consumer Electron.
- ICASSP
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