IMAGE DEGRADATION
Experts
- Huib de Ridder
- Kazuki Endo
- Masayuki Tanaka
- Sarbani Palit
- Ankan Bhattacharya
- Masatoshi Okutomi
- Alan C. Bovik
- Damon M. Chandler
- Leida Li
- Sanghoon Lee
- Jan Flusser
- Tianxiang Hu
- Fahim Faisal Niloy
- Kenneth C. Young
- Sajad Farokhi
- Piet Wambacq
- Gourav Roy
- Tero Karras
- Michael E. Miller
- Bhavya Goyal
- Jürgen Jung
- Sophie Triantaphillidou
- Tomás Suk
- Aladine Chetouani
- William Kress
- Janne Hellsten
- Jiaxiang Liu
- Charlotte Soens
- Timotheus J. W. M. Janssen
- Geert Van der Plas
- Cyril Höschl IV
- Azeddine Beghdadi
- Thierry Trémas
- Wanghui Ding
- Samuli Laine
- Jongyoo Kim
- Mohit Gupta
- Jaakko Lehtinen
- Simon S. Woo
Venues
- CoRR
- PICS
- IQSP
- Human Vision and Electronic Imaging
- J. Digit. Imaging
- Color Imaging Conference
- CVPR
- Remote. Sens.
- ICASSP
- IEEE Access
- ICIP
- EMBC
- IET Image Process.
- Microelectron. Reliab.
- IEEE Trans. Image Process.
- IGARSS
- Sensors
- EUSIPCO
- IEEE Trans. Instrum. Meas.
- SMC
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Reliab.
- NeuroImage
- Medical Imaging: Image Processing
- ICIP (2)
- Multim. Tools Appl.
- J. Electronic Imaging
- ICIP (1)
- Digital Mammography / IWDM
- IEICE Trans. Electron.
- Symmetry
- ICDAR
- Earth Observing Systems
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEEE Trans. Geosci. Remote. Sens.
- ISPRS Int. J. Geo Inf.
- ICB
- VISAPP (1)
- Pattern Recognit. Lett.
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