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Experts
- Hiroshi Iwai
- Eugenio Culurciello
- Hei Wong
- Kuniyuki Kakushima
- Udo Schwalke
- George J. Papaioannou
- Vivek De
- Mst Shamim Ara Shawkat
- Andreas G. Andreou
- Frank Wessely
- Hao Li
- Nicole McFarlane
- Tillmann Krauss
- Charles F. Hawkins
- Mohammad Athar Khalil
- Jong-Tae Park
- Meer Sakib
- Nobuyuki Sugii
- Jerry M. Soden
- James E. Jaussi
- Joris Van Campenhout
- Ranjeet Kumar
- Andrea Cester
- Chin-Long Wey
- Matroni Koutsoureli
- Kazuo Tsutsui
- H. W. Chen
- Haisheng Rong
- Takamasa Kawanago
- Ganesh Balamurugan
- James W. Tschanz
- Gaudenzio Meneghesso
- P. T. Lai
- Fu-Chien Chiu
- Tsung-Yang Liow
- Zeyang Ren
- Chang-Chih Chen
- Matteo Repossi
- Enrico Temporiti
Venues
- Microelectron. Reliab.
- Sensors
- IEICE Trans. Electron.
- IEEE J. Solid State Circuits
- IRPS
- Microelectron. J.
- IBM J. Res. Dev.
- ISCAS
- IEEE Access
- OFC
- ISSCC
- ESSDERC
- NEMS
- IEICE Electron. Express
- Sci. China Inf. Sci.
- ESSCIRC
- ICICDT
- ITC
- CICC
- DRC
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE SENSORS
- VLSI Circuits
- ECOC
- IEEE Trans. Circuits Syst. II Express Briefs
- DAC
- Proc. IEEE
- IET Circuits Devices Syst.
- DTIS
- OFC/NFOEC
- ISCAS (4)
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- VLSI Technology and Circuits
- ISQED
- J. Low Power Electron.
- ICKII
- BioCAS
- Sci. China Ser. F Inf. Sci.
- ICECS
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