GATE DIELECTRICS
Experts
- Hiroshi Iwai
- Eugenio Culurciello
- Hei Wong
- Udo Schwalke
- Kuniyuki Kakushima
- George J. Papaioannou
- Hao Li
- Andreas G. Andreou
- Nicole McFarlane
- Vivek De
- Frank Wessely
- Tillmann Krauss
- Mst Shamim Ara Shawkat
- Nobuyuki Sugii
- Ganesh Balamurugan
- Mohammad Athar Khalil
- James E. Jaussi
- Ranjeet Kumar
- Chin-Long Wey
- Haisheng Rong
- P. T. Lai
- Takamasa Kawanago
- Andrea Cester
- Joris Van Campenhout
- Matroni Koutsoureli
- Jerry M. Soden
- Jong-Tae Park
- Meer Sakib
- H. W. Chen
- Kazuo Tsutsui
- Gaudenzio Meneghesso
- James W. Tschanz
- Charles F. Hawkins
- Joseph Nahas
- Ning Lu
- Li-Hong Pan
- Gang Du
- Ru Huang
- Gabriele Minoia
Venues
- Microelectron. Reliab.
- IEICE Trans. Electron.
- Sensors
- IRPS
- IEEE J. Solid State Circuits
- Microelectron. J.
- ISCAS
- IBM J. Res. Dev.
- OFC
- IEEE Access
- ESSDERC
- ISSCC
- NEMS
- IEICE Electron. Express
- Sci. China Inf. Sci.
- ESSCIRC
- ICICDT
- CICC
- IEEE Trans. Circuits Syst. I Regul. Pap.
- DRC
- ITC
- ECOC
- VLSI Circuits
- IET Circuits Devices Syst.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ISCAS (4)
- IEEE Trans. Circuits Syst. II Express Briefs
- DTIS
- DAC
- IEEE SENSORS
- OFC/NFOEC
- Proc. IEEE
- J. Low Power Electron.
- MIPRO
- SmartIoT
- IEEE Trans. Very Large Scale Integr. Syst.
- Circuits Syst. Signal Process.
- IEEE Trans. Biomed. Circuits Syst.
- Sci. China Ser. F Inf. Sci.
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