FITTING METHOD
Experts
- Simon Baker
- Klaus Voss
- Robert B. Fisher
- Dilip K. Prasad
- Herbert Süße
- Maylor K. H. Leung
- Andreas Jakobsson
- Maja Pantic
- Aldo Bonfiglioli
- Georgios Tzimiropoulos
- Ying Liu
- Xiaoyi Jiang
- Averill M. Law
- Renato Paciorri
- Qing Jiang
- Fulin Tang
- Johan Sward
- Debasis Chaudhuri
- Sanqing Qu
- Wei Xu
- Ulrich Reif
- Xianyu Ge
- Johan Brynolfsson
- Hoda Daou
- Akemi Gálvez
- Holger Schultheis
- Chai Quek
- Michael Rübsamen
- Akihiro Sugimoto
- Qually Jiang
- Li Zhang
- Yun Ye
- Peter Buchholz
- Ming Lu
- Zhongcong Xu
- Jianmin Zheng
- Yixin Ge
- Julien Peyras
- Partha P. Mitra
Venues
- CoRR
- IEEE Access
- IEEE Trans. Signal Process.
- ICASSP
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Instrum. Meas.
- Pattern Recognit.
- Sensors
- J. Comput. Chem.
- WSC
- Comput. Aided Geom. Des.
- Pattern Recognit. Lett.
- Int. J. Pattern Recognit. Artif. Intell.
- ISBI
- Comput. Phys. Commun.
- Remote. Sens.
- J. Comput. Appl. Math.
- DAGM-Symposium
- IGARSS
- ICIP
- Int. J. Comput. Vis.
- GRMSE (2)
- EUSIPCO
- Vis. Comput.
- Symmetry
- Comput. Stat. Data Anal.
- BMVC
- IEEE Geosci. Remote. Sens. Lett.
- CVPR Workshops
- VMV
- Comput. Biol. Medicine
- FG
- IEEE Trans. Ind. Electron.
- VISAPP (1)
- Comput. Graph. Forum
- Int. J. Distributed Sens. Networks
- CoDIT
- Eur. J. Oper. Res.
- EMBC
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