FIGURE OF MERIT
Experts
- Chin-Hui Lee
- Kevin W. Bowyer
- Josef Kittler
- Djemel Ziou
- Arnau Mir
- Sebastià Massanet
- Manuel González Hidalgo
- Mark Johnston
- Sean Dougherty
- Wenlong Fu
- Mengjie Zhang
- Ville Hautamäki
- Patricia Melin
- Ivan Kukanov
- Michael P. Beddoes
- Muhittin Gökmen
- Robert M. Haralick
- Michel Chapron
- Peng-Lang Shui
- Didier Demigny
- Mehdi Kiani
- Wolfram H. H. J. Lunscher
- Christine Kranenburg
- Daniel Ruiz-Aguilera
- Olivia Mendoza
- Maria Petrou
- Kazunori Kotani
- Mohamed M. Bayoumi
- Jacquelyn S. Fetrow
- Anil K. Jain
- Qian Xiao
- Caixia Zhou
- Travis Riggs
- Tat-Seng Chua
- Kehuang Li
- Mubarak Shah
- Anca Andreica
- Akira Matsuzawa
- John See
Venues
- CoRR
- ICASSP
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- ISCAS
- Pattern Recognit.
- CVPR
- EUSIPCO
- IEEE Access
- Signal Process.
- Pattern Recognit. Lett.
- EMBC
- Color Imaging Conference
- Entropy
- ICPR (3)
- Comput. Vis. Image Underst.
- IECON
- ICIAP
- Image Vis. Comput.
- VLSI Design
- ICECS
- Multim. Tools Appl.
- IEEE Trans. Signal Process.
- PICS
- ISCAS (4)
- IEEE J. Solid State Circuits
- IEEE Trans. Speech Audio Process.
- ACIVS
- ICIP (2)
- IEEE Trans. Syst. Man Cybern.
- OFC
- J. Circuits Syst. Comput.
- Graphs Comb.
- CinC
- SIU
- J. Multiple Valued Log. Soft Comput.
- IEEE Trans. Circuits Syst. II Express Briefs
- VCIP
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