FIGURE OF MERIT
Experts
- Chin-Hui Lee
- Kevin W. Bowyer
- Josef Kittler
- Sebastià Massanet
- Djemel Ziou
- Arnau Mir
- Manuel González Hidalgo
- Mengjie Zhang
- Mark Johnston
- Sean Dougherty
- Wenlong Fu
- Ivan Kukanov
- Christine Kranenburg
- Didier Demigny
- Patricia Melin
- Michel Chapron
- Robert M. Haralick
- Wolfram H. H. J. Lunscher
- Ville Hautamäki
- Mehdi Kiani
- Muhittin Gökmen
- Peng-Lang Shui
- Daniel Ruiz-Aguilera
- Michael P. Beddoes
- Olivia Mendoza
- Chaozhi Yang
- Ling-Hwei Chen
- Delia Dumitru
- Dominique Houzet
- Akira Matsuzawa
- Yaping Huang
- T. Hoang Ngan Le
- Humberto Bustince Sola
- Mohamed M. Bayoumi
- Chandra Shekhar
- Michael J. Vrhel
- K. Paler
- Jacquelyn S. Fetrow
- Oscar Castillo
Venues
- CoRR
- ICASSP
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- ISCAS
- Pattern Recognit.
- CVPR
- Signal Process.
- IEEE Access
- Pattern Recognit. Lett.
- EMBC
- EUSIPCO
- Comput. Vis. Image Underst.
- Color Imaging Conference
- IECON
- ICPR (3)
- Entropy
- PICS
- IEEE Trans. Signal Process.
- Multim. Tools Appl.
- ICIAP
- IEEE J. Solid State Circuits
- VLSI Design
- IEEE Trans. Speech Audio Process.
- ICIP (2)
- ICECS
- Image Vis. Comput.
- ACIVS
- IEEE Trans. Syst. Man Cybern.
- ISCAS (4)
- IEEE Congress on Evolutionary Computation
- J. Comput.
- IGARSS
- Digital Photography
- SIU
- ICNN
- J. Circuits Syst. Comput.
- IEEE Trans. Circuits Syst. II Express Briefs
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend