FEATURE ANALYSIS
Experts
- B. V. K. Vijaya Kumar
- Marios Savvides
- Shiguang Shan
- Mark S. Nixon
- Rama Chellappa
- Xilin Chen
- Hemant A. Patil
- Josef Kittler
- Xiaojun Chang
- Dacheng Tao
- Weihong Deng
- Yan Yan
- Hanzi Wang
- Jian Yang
- Wen Gao
- Wanquan Liu
- Qingmin Liao
- Chunyan Xie
- Jie Yang
- Liang Wang
- Xiaoou Tang
- Stan Z. Li
- Shangfei Wang
- Thambipillai Srikanthan
- Thomas S. Huang
- Baochang Zhang
- David Zhang
- Weifeng Li
- Harry Wechsler
- Jiwen Lu
- Qiang Ji
- Meng Yang
- Jeffrey F. Cohn
- Terence Sim
- Changhong Fu
- Simon Lucey
- Anshu Chittora
- Yang Liu
- Tieniu Tan
Venues
- CoRR
- IEEE Access
- Sensors
- Multim. Tools Appl.
- Pattern Recognit.
- ICASSP
- ICIP
- EMBC
- Neurocomputing
- INTERSPEECH
- ICPR
- Pattern Recognit. Lett.
- CVPR
- Expert Syst. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Biomed. Signal Process. Control.
- J. Electronic Imaging
- IJCNN
- IEEE Trans. Image Process.
- IGARSS
- Remote. Sens.
- CCBR
- CVPR Workshops
- ICME
- SMC
- SIU
- IEEE Signal Process. Lett.
- EUSIPCO
- J. Vis. Commun. Image Represent.
- IEEE Trans. Geosci. Remote. Sens.
- Signal Image Video Process.
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Biol. Medicine
- AVBPA
- FG
- IEEE Trans. Circuits Syst. Video Technol.
- WACV
- IJCB
- Inf. Sci.
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