FAILURE MODES AND EFFECTS
Experts
- Myron Hecht
- Mark H. Lee
- David Parker
- Yiannis Papadopoulos
- Enrico Vicario
- Muhammet Gul
- Nicholas R. Jennings
- Kai Meng Tay
- David J. Woollons
- Michael J. Wooldridge
- Christian Grante
- Irene Bicchierai
- David Kinny
- Julia Pinchak
- Luigi Portinale
- Neal Andrew Snooke
- Andrea Bobbio
- Andrea Bondavalli
- Paul G. Hawkins
- Giacomo Bucci
- Jiafu Su
- David Baum
- Yi-Zeng Chen
- Kamalasen Rajalingham
- László Pokorádi
- Zahir Irani
- Charles Danquigny
- C. R. Burrows
- Christoph Binder
- Thomas D. Nielsen
- Hervé Jourde
- Shibo Wu
- Enxi Chou
- Davide Basile
- Kumar K. Goswami
- Caterina Rizzi
- Shravan Kumar Akula
- Marcello Chiaberge
- M. Manojkummar
Venues
- CoRR
- DSN
- SAFECOMP
- Soft Comput.
- Appl. Soft Comput.
- ICIBE
- ESM
- INTERACT
- Int. J. Crit. Infrastructures
- ACM SIGSOFT Softw. Eng. Notes
- Expert Syst. Appl.
- Comput. Ind.
- Qual. Reliab. Eng. Int.
- Reliab. Eng. Syst. Saf.
- J. Oper. Res. Soc.
- Int. J. Comput. Integr. Manuf.
- Int. J. Crit. Comput. Based Syst.
- Microelectron. Reliab.
- ISSRE Workshops
- Comput. Syst. Sci. Eng.
- LADC
- Autom.
- Commun. ACM
- SIU
- Simul. Model. Pract. Theory
- SISY
- JURIX
- DATE
- QRS
- EKAW
- Comput. Sci. Rev.
- Int. J. Simul. Process. Model.
- Environ. Model. Softw.
- RTSI
- Agents
- Int. J. Syst. Sci.
- MWSCAS
- CODAS
- Eng. Appl. Artif. Intell.
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