FACIAL SURFACE NORMALS
Experts
- Edwin R. Hancock
- William A. P. Smith
- Philip L. Worthington
- Jean-Denis Durou
- Hossein Ragheb
- Emmanuel Prados
- Jing Wu
- Fabio Sartori
- Alain Crouzil
- José R. A. Torreão
- Olivier D. Faugeras
- Alfred M. Bruckstein
- John Oliensis
- Kwang Nam Choi
- Wen Liu
- Rui Huang
- Fumio Yamazaki
- Paul Dupuis
- Fabien Castan
- Stephan R. Richter
- Attila Fazekas
- Paola Rizzoli
- Katsushi Ikeuchi
- Yee-Hong Yang
- Orazio Gallo
- Silvia Tozza
- Josué Ruano
- Sang Uk Lee
- Allan D. Jepson
- Fabio Camilli
- Jinwei Gu
- Tania Stathaki
- Salah Bourennane
- Peter H. R. Green
- Chao Wang
- Pierre Gurdjos
- Ping Hao
- Jan Kautz
- Nor Ashidi Mat Isa
Venues
- Pattern Recognit.
- CVPR
- ECCV (2)
- ICIP
- SSPR/SPR
- BMVC
- CoRR
- J. Imaging
- VISAPP (2)
- IGARSS
- IMA Conference on the Mathematics of Surfaces
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Math. Imaging Vis.
- CVPR Workshops
- Artif. Intell.
- ICPR (1)
- ISPA
- AAAI
- Int. J. Imaging Syst. Technol.
- J. Comput. Sci. Technol.
- Pattern Anal. Appl.
- AsiaSim (1)
- Int. J. Intell. Syst. Technol. Appl.
- TAROS
- SIBGRAPI
- TFCV
- ICIP (2)
- CVGIP Image Underst.
- Comput. Medical Imaging Graph.
- IEEE Geosci. Remote. Sens. Lett.
- SMAP
- IJCAI
- Int. J. Comput. Vis.
- Comput. Vis. Graph. Image Process.
- ECCV (1)
- IbPRIA (1)
- ICIAR
- CAIP
- Int. J. Comput. Math.
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