FACIAL NEEDLE MAPS
Experts
- Edwin R. Hancock
- William A. P. Smith
- Jing Wu
- Modesto Castrillón Santana
- Juan E. Tapia
- Yunhong Wang
- Javier Lorenzo-Navarro
- Chawki Djeddi
- Imran Siddiqi
- Enrique Ramón-Balmaseda
- Karl Ricanek
- Boulbaba Ben Amor
- Hazim Kemal Ekenel
- Claudio A. Perez
- Christoph Busch
- Mohamed Daoudi
- Cuixian Chen
- Ajita Rattani
- Abdeljalil Gattal
- Giovanni Abramo
- Changyin Sun
- Ciriaco Andrea D'Angelo
- Qing Tian
- Abdesselam Bouzerdoum
- Ikram Syed
- Michele Nappi
- Wankou Yang
- Haizhou Ai
- Pengfei Shi
- Baiqiang Xia
- Ming-Hsuan Yang
- Yoshio Iwai
- Mircea Nicolescu
- Tal Arbel
- George Bebis
- Ramón Alberto Mollineda
- Rajendra S. Gad
- Narayan Vetrekar
- Yishi Wang
Venues
- CoRR
- ICPR
- INTERSPEECH
- Multim. Tools Appl.
- CLEF (Working Notes)
- CVPR Workshops
- Neural Comput. Appl.
- IEEE Access
- IJCNN
- J. Electronic Imaging
- Pattern Recognit.
- Pattern Recognit. Lett.
- ICIP
- IET Biom.
- Manag. Sci.
- Pattern Anal. Appl.
- Image Vis. Comput.
- ICASSP
- CIARP
- IJCB
- IEEE Trans. Inf. Forensics Secur.
- SIBGRAPI
- Neurocomputing
- WACV
- SIU
- Comput. Hum. Behav.
- Scientometrics
- ICCV Workshops
- Sensors
- ICB
- Expert Syst. Appl.
- J. Res. Pract. Inf. Technol.
- J. Vis. Commun. Image Represent.
- ICFHR
- Interactions
- SITIS
- BIOSIG
- WebSci
- IEEE BigData
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