FACIAL NEEDLE MAPS
Experts
- Edwin R. Hancock
- William A. P. Smith
- Jing Wu
- Modesto Castrillón Santana
- Juan E. Tapia
- Javier Lorenzo-Navarro
- Yunhong Wang
- Imran Siddiqi
- Enrique Ramón-Balmaseda
- Chawki Djeddi
- Karl Ricanek
- Mohamed Daoudi
- Hazim Kemal Ekenel
- Boulbaba Ben Amor
- Christoph Busch
- Claudio A. Perez
- Qing Tian
- Changyin Sun
- Ajita Rattani
- Cuixian Chen
- Giovanni Abramo
- Abdeljalil Gattal
- Ciriaco Andrea D'Angelo
- Yishi Wang
- Kiran B. Raja
- Michele Nappi
- Masashi Nishiyama
- Bao-Liang Lu
- Wojciech Samek
- Wankou Yang
- Eileen M. Trauth
- Lahoucine Ballihi
- Fevziye Irem Eyiokur
- Yoshio Iwai
- Ramón Alberto Mollineda
- Abdesselam Bouzerdoum
- Serestina Viriri
- Tal Arbel
- James J. Clark
Venues
- CoRR
- ICPR
- INTERSPEECH
- Multim. Tools Appl.
- CLEF (Working Notes)
- CVPR Workshops
- Neural Comput. Appl.
- J. Electronic Imaging
- Pattern Recognit. Lett.
- ICIP
- IEEE Access
- Pattern Recognit.
- IJCNN
- Pattern Anal. Appl.
- IET Biom.
- ICASSP
- CIARP
- Manag. Sci.
- IJCB
- Image Vis. Comput.
- Expert Syst. Appl.
- SIU
- ICCV Workshops
- ICB
- Comput. Hum. Behav.
- Sensors
- SIBGRAPI
- IEEE Trans. Inf. Forensics Secur.
- Neurocomputing
- Scientometrics
- WACV
- BMVC
- AI Soc.
- ICPR (3)
- IET Comput. Vis.
- J. Inf. Sci. Eng.
- ISBA
- IbPRIA (1)
- Biomed. Signal Process. Control.
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