FACIAL LANDMARKS
Experts
- Georgios Tzimiropoulos
- Jiankang Deng
- Ioannis A. Kakadiaris
- Stefanos Zafeiriou
- Shishir K. Shah
- Mohamed Abdel-Mottaleb
- Mohamed Daoudi
- Vitomir Struc
- Christoph Busch
- Dakshina Ranjan Kisku
- Adrian Bulat
- Phalguni Gupta
- Rama Chellappa
- John See
- Dong Seog Han
- Peter Peer
- Shaun J. Canavan
- Ziga Emersic
- Qingshan Liu
- Honggang Qi
- Luis Baumela
- Dimitris N. Metaxas
- Hiroshi Kobayashi
- Gérard G. Medioni
- Zhichun Mu
- Veikko Surakka
- Tal Hassner
- Thomas F. Hansen
- Muhammad Awais
- Vojtech Franc
- Massimo Tistarelli
- Julian Fiérrez
- Asuman Günay
- Vasif V. Nabiyev
- Boulbaba Ben Amor
- Yunhong Wang
- Xiang Yu
- Jan Cech
- Chaowei Fang
Venues
- CoRR
- FG
- ICIP
- IEEE Access
- ICPR
- Neurocomputing
- Multim. Tools Appl.
- ICCV Workshops
- ACM Multimedia
- CVPR Workshops
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- CVPR
- BMVC
- AAAI
- ICME
- Sensors
- IEEE Trans. Image Process.
- Int. J. Comput. Vis.
- Pattern Recognit. Lett.
- J. Electronic Imaging
- ICCV
- Comput. Vis. Image Underst.
- ICASSP
- Symmetry
- WACV
- FGR
- EMBC
- ICB
- MVA
- IJCNN
- Image Vis. Comput.
- Neural Comput. Appl.
- SMC
- Expert Syst. Appl.
- Int. J. Biom.
- CISP-BMEI
- Comput. Graph. Forum
- IPTA
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