FACE DETECTOR
Experts
- Stan Z. Li
- Zhen Lei
- Xilin Chen
- Rama Chellappa
- Shiguang Shan
- Shifeng Zhang
- Wen Gao
- Haizhou Ai
- Junjie Yan
- Hazem M. El-Bakry
- Modesto Castrillón Santana
- Muhamad Dwisnanto Putro
- Vishal M. Patel
- Anil K. Jain
- Kang-Hyun Jo
- Chen Change Loy
- Brian C. Lovell
- Thomas S. Huang
- Chengjie Wang
- Guangyou Xu
- Xiaobo Wang
- Jian Li
- Ioannis Pitas
- Xiaoou Tang
- Yu Liu
- Anastasios Tefas
- Javier Lorenzo-Navarro
- Shihong Lao
- Ran He
- Yabiao Wang
- Daijin Kim
- Josef Kittler
- Marios Savvides
- Xiangyu Zhu
- Olivier Bernier
- Konstantinos N. Plataniotis
- Shuzhe Wu
- Shuo Yang
- Ioannis A. Kakadiaris
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- CVPR
- IEEE Access
- Sensors
- ICPR
- FG
- Pattern Recognit. Lett.
- Pattern Recognit.
- ICASSP
- ICME
- IEEE Trans. Pattern Anal. Mach. Intell.
- SMC
- ICCV
- IEEE Trans. Instrum. Meas.
- IGARSS
- CVPR Workshops
- IJCNN
- Image Vis. Comput.
- Neurocomputing
- WACV
- ICIP (3)
- ICB
- AVBPA
- ICIP (1)
- ACM Multimedia
- Int. J. Pattern Recognit. Artif. Intell.
- CCBR
- Remote. Sens.
- IEICE Trans. Inf. Syst.
- FGR
- NeuroImage
- ICPR (1)
- ICPR (2)
- ICDIP
- IPCV
- MVA
- J. Electronic Imaging
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