EMPIRICAL EVALUATION
Experts
- Marcello Federico
- Zahir Irani
- Nathaniel Huber-Fliflet
- Sabarish V. Babu
- Haozhen Zhao
- Luigi Lavazza
- Jan Niehues
- Sebastian Stüker
- Lionel C. Briand
- Sandro Morasca
- Shin Yoo
- Peter E. D. Love
- Lutz Bornmann
- Carl-Johan H. Seger
- Burak Turhan
- Thomas Scialom
- Pedro M. d'Orey
- Akito Monden
- Jakob Pinggera
- James Miller
- Mauro Cettolo
- Jianping Zhang
- Barbara Weber
- Lei Xie
- Lech Madeyski
- Rishi Chhatwal
- Ruyun Chen
- Robert Keeling
- Hatem Haddad
- Stefan Wagner
- Maya Daneva
- Roee Aharoni
- Sebastian Müller
- Mourad Gridach
- Thomas Vogel
- Hala Mulki
- David Scott Warren
- Katsuto Nakajima
- Stephanie Seneff
Venues
- CoRR
- Inf. Softw. Technol.
- Sensors
- Scientometrics
- CHI
- INTERSPEECH
- IEEE Trans. Instrum. Meas.
- Remote. Sens.
- IEEE Access
- EMBC
- LREC
- J. Syst. Softw.
- Empir. Softw. Eng.
- Numer. Algorithms
- Comput. J.
- IGARSS
- IEEE Trans. Software Eng.
- ICASSP
- IACR Cryptol. ePrint Arch.
- Microelectron. Reliab.
- J. Assoc. Inf. Sci. Technol.
- SMC
- HICSS
- CHI Extended Abstracts
- Entropy
- AMCIS
- AMIA
- WSC
- Reliab. Eng. Syst. Saf.
- Inf. Process. Manag.
- J. Comput. Appl. Math.
- Commun. ACM
- IWSLT
- VTC Spring
- Decis. Support Syst.
- ISSRE
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Intell. Fuzzy Syst.
- VTC Fall
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