ELECTRON MICROSCOPE
Experts
- José-Jesús Fernández
- Junichi Nakayama
- Charles A. Bouman
- Yasuhiko Tamura
- Kun-Shan Chen
- George A. Tsihrintzis
- Limeng Dong
- Hui-Ming Wang
- Lawrence F. Drummy
- Andreas K. Maier
- Albert F. Lawrence
- Kevin G. Yager
- Qingqing Wu
- Anthony J. Devaney
- Ying Yang
- Inmaculada García
- Xiaohua Wan
- Samuli Siltanen
- Francesco Soldovieri
- Yoav Y. Schechner
- Fa Zhang
- Sebastien Phan
- Zachary H. Levine
- Ge Wang
- Jesús Carretero
- S. V. Venkatakrishnan
- José María Carazo
- Derrick Wing Kwan Ng
- Wen Chen
- Zhiyong Liu
- Matteo Pardini
- Michael E. Glinsky
- Angela P. Cuadros
- Mark H. Ellisman
- Kazuhiro Hattori
- Ali Mohammad-Djafari
- Demetri Psaltis
- Adrian Schwaninger
- Xusheng Zhu
Venues
- CoRR
- Sensors
- IGARSS
- Comput. Phys. Commun.
- IEEE Trans. Geosci. Remote. Sens.
- Symmetry
- ISBI
- IEICE Trans. Electron.
- IEEE Trans. Medical Imaging
- Microelectron. Reliab.
- IEEE Access
- J. Comput. Chem.
- SIAM J. Appl. Math.
- ICIP
- IEEE Geosci. Remote. Sens. Lett.
- Remote. Sens.
- Computational Imaging
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Biomed. Eng.
- Int. J. Imaging Syst. Technol.
- IBM J. Res. Dev.
- IEEE Trans. Computational Imaging
- Microelectron. J.
- EMBC
- IEEE Trans. Veh. Technol.
- OFC
- ICASSP
- BMC Bioinform.
- Medical Imaging: Image Processing
- SIAM J. Imaging Sci.
- IEEE Trans. Image Process.
- J. Imaging
- J. Comput. Phys.
- VLSI Design
- SIAM J. Sci. Comput.
- Comput. Geosci.
- Quantum Inf. Process.
- Appl. Math. Comput.
- Proc. IEEE
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