ELECTRON MICROSCOPE
Experts
- Junichi Nakayama
- José-Jesús Fernández
- Yasuhiko Tamura
- Kun-Shan Chen
- Charles A. Bouman
- Limeng Dong
- George A. Tsihrintzis
- Lawrence F. Drummy
- Hui-Ming Wang
- Andreas K. Maier
- Ying Yang
- Xiaohua Wan
- Qingqing Wu
- Anthony J. Devaney
- Inmaculada García
- Kevin G. Yager
- Albert F. Lawrence
- Sebastien Phan
- Ge Wang
- Samuli Siltanen
- Fa Zhang
- Francesco Soldovieri
- José María Carazo
- Zachary H. Levine
- S. V. Venkatakrishnan
- Jesús Carretero
- Yoav Y. Schechner
- Gonzalo R. Arce
- Matteo Pardini
- Wen Chen
- Michael E. Glinsky
- Mark H. Ellisman
- Ester M. Garzón
- Kazuhiro Hattori
- Angela P. Cuadros
- Ali Mohammad-Djafari
- Demetri Psaltis
- Xusheng Zhu
- Derrick Wing Kwan Ng
Venues
- CoRR
- Sensors
- IGARSS
- Comput. Phys. Commun.
- IEEE Trans. Geosci. Remote. Sens.
- ISBI
- Symmetry
- IEEE Trans. Medical Imaging
- IEICE Trans. Electron.
- Microelectron. Reliab.
- IEEE Access
- J. Comput. Chem.
- SIAM J. Appl. Math.
- ICIP
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Instrum. Meas.
- Remote. Sens.
- Computational Imaging
- IEEE Trans. Biomed. Eng.
- Int. J. Imaging Syst. Technol.
- Microelectron. J.
- IBM J. Res. Dev.
- IEEE Trans. Computational Imaging
- ICASSP
- BMC Bioinform.
- OFC
- IEEE Trans. Veh. Technol.
- EMBC
- J. Imaging
- IEEE Trans. Image Process.
- Medical Imaging: Image Processing
- SIAM J. Imaging Sci.
- Comput. Geosci.
- Appl. Math. Comput.
- Quantum Inf. Process.
- VLSI Design
- J. Comput. Phys.
- SIAM J. Sci. Comput.
- Proc. IEEE
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