ELASTIC GRAPH MATCHING
Experts
- Kevin W. Bowyer
- Ioannis Pitas
- Adam Czajka
- Anastasios Tefas
- Constantine Kotropoulos
- Michael C. King
- Andreas Uhl
- Vítor Albiero
- Josef Kittler
- Zhenan Sun
- Sébastien Marcel
- Michele Nappi
- Andrey Kuehlkamp
- Aidan Boyd
- Andrea F. Abate
- Daniel González-Jiménez
- Daniel Riccio
- Maria De Marsico
- Tieniu Tan
- Samy Bengio
- Mohammad Sadeghi
- Piotr Maciejewicz
- José Luis Alba-Castro
- Conrad Sanderson
- Mateusz Trokielewicz
- Daniel Moreira
- Richard P. Wildes
- Richa Singh
- Xiaodong Zhu
- Hunny Mehrotra
- Christian Rathgeb
- Yu-Ting Li
- Gabriel Cristóbal
- Maria Petrou
- Enrico Grosso
- Luc Vandendorpe
- Juan P. Wachs
- Mayank Vatsa
- Sheng-Wen Shih
Venues
- CoRR
- Pattern Recognit.
- ICASSP
- ICPR
- Pattern Recognit. Lett.
- ICIP
- Image Vis. Comput.
- ICIP (1)
- IEEE Trans. Inf. Forensics Secur.
- AVBPA
- ICDAR
- EUSIPCO
- IIH-MSP
- Signal Image Video Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICBA
- INTERSPEECH
- ICB
- BTAS
- EURASIP J. Adv. Signal Process.
- Sensors
- Pattern Anal. Appl.
- Comput. Vis. Image Underst.
- IWBF
- CCBR
- Int. J. Speech Technol.
- CVPR
- CVPR Workshops
- IEEE Access
- ACPR
- WACV
- IET Biom.
- Multim. Tools Appl.
- Signal Process.
- J. Frankl. Inst.
- SAC
- CIB
- Expert Syst. Appl.
- BMVC
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