EDGE LOCALIZATION
Experts
- J. Andrew Bangham
- Rachid Deriche
- Richard W. Harvey
- Bernard De Baets
- Luc Florack
- Carlos Lopez-Molina
- Josef Kittler
- Jean Pierre Cocquerez
- Alison Bosson
- Djemel Ziou
- Olivier Monga
- Grégoire Malandain
- Muhittin Gökmen
- Humberto Bustince Sola
- Chin-Chen Chang
- Mikel Galar
- Lucas J. van Vliet
- Haruko Okamura
- Wenhua Ma
- Piet W. Verbeek
- Michel Chapron
- Arjan Kuijper
- Robert M. Haralick
- James J. Clark
- Mostafa Kaveh
- Donna J. Williams
- Anil K. Jain
- Baptiste Magnier
- Stefano Tubaro
- Yu-Li You
- Mario Coutino
- John Illingworth
- Federico Pedersini
- Mads Nielsen
- Philippe Montesinos
- Alfred O. Hero III
- Mubarak Shah
- Geert Leus
- Qian-Ru Wei
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- Pattern Recognit.
- J. Math. Imaging Vis.
- EUSIPCO
- CVPR
- Discret. Math.
- Image Vis. Comput.
- IGARSS
- ICASSP
- BMVC
- VCIP
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Vis. Image Underst.
- Electron. J. Comb.
- ICPR (1)
- ACIVS
- ICIP
- Ars Comb.
- Int. J. Pattern Recognit. Artif. Intell.
- J. Graph Theory
- ICIAP
- Scale-Space
- ICPR (3)
- J. Electronic Imaging
- ECCV (1)
- J. Multiple Valued Log. Soft Comput.
- ICIP (3)
- Multim. Tools Appl.
- IEEE Access
- MECO
- Biomed. Signal Process. Control.
- ICNN
- Discret. Appl. Math.
- EMBC
- Bildverarbeitung für die Medizin
- PRCV (10)
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