EDGE DETECTION ALGORITHM
Experts
- Mark Johnston
- Mengjie Zhang
- Robert M. Haralick
- Wenlong Fu
- Xiangjian He
- Rachid Deriche
- Mahdi Setayesh
- Olivier Monga
- Tom Hintz
- Spiros Fotopoulos
- Boaz Nadler
- Muhittin Gökmen
- Sun-Yuan Hsieh
- Bernard De Baets
- George Economou
- Scott T. Acton
- Alex Pappachen James
- Carlos Lopez-Molina
- Meirav Galun
- Josef Kittler
- Ronen Basri
- Javier Montero
- Yoshihiro Okada
- Dong Hoon Lim
- Achi Brandt
- Zhao Zhang
- Grégoire Malandain
- Djemel Ziou
- Rajiv Mehrotra
- Yunfan Ye
- Ching-Chung Li
- James S. J. Lee
- Nati Ofir
- Zhiping Cai
- Qiang Wu
- Edward J. Delp
- Daniel Gómez
- Rae-Hong Park
- Jean Pierre Cocquerez
Venues
- CoRR
- Pattern Recognit.
- ICASSP
- ICIP
- CVPR
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- IEEE Access
- Image Vis. Comput.
- ISCAS
- IGARSS
- Multim. Tools Appl.
- J. Intell. Fuzzy Syst.
- J. Math. Imaging Vis.
- EUSIPCO
- Discret. Math.
- Int. J. Comput. Vis.
- IEEE Trans. Syst. Man Cybern.
- Comput. Vis. Graph. Image Process.
- ICIP (3)
- Inf. Process. Lett.
- IET Image Process.
- ICPR (1)
- Signal Process.
- Signal Image Video Process.
- ICIP (2)
- Visual Information Processing
- J. Electronic Imaging
- SMC
- ICIP (1)
- Int. J. Pattern Recognit. Artif. Intell.
- 计算机科学
- ICDIP
- J. Graph Theory
- Vis. Comput.
- SIU
- Theor. Comput. Sci.
- Alvey Vision Conference
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