DUTY CYCLE
Experts
- Tian He
- Yu Gu
- Taewhan Kim
- Marian K. Kazimierczuk
- Ming-Dou Ker
- Baris Taskin
- Anfeng Liu
- Chulwoo Kim
- Kuo-Hsing Cheng
- Eby G. Friedman
- Shen-Iuan Liu
- Takahiro J. Yamaguchi
- Long Cheng
- Jianwei Niu
- Kari Halonen
- Pavan Kumar Hanumolu
- Saibal Mukhopadhyay
- Tian Wang
- Guihai Chen
- Zhichao Cao
- Haruo Kobayashi
- Vivek De
- Shih-Hsu Huang
- Diana Marculescu
- Akira Matsuzawa
- Vishwani D. Agrawal
- Yann-Hang Lee
- Hengjing Liang
- Takayasu Sakurai
- Jaehyouk Choi
- Zhi Chen
- Massimo Alioto
- Yao-Wen Chang
- Shailesh Singh Chouhan
- Monodeep Kar
- C. Mani Krishna
- Wing-Hung Ki
- Shuo Guo
- Ching-Yuan Yang
Venues
- IEEE Trans. Ind. Electron.
- ISCAS
- IEEE Access
- IECON
- IEEE J. Solid State Circuits
- CoRR
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEICE Electron. Express
- Microelectron. J.
- ISSCC
- Sensors
- ICECS
- CICC
- IEICE Trans. Electron.
- Int. J. Circuit Theory Appl.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- MWSCAS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ICCAD
- ESSCIRC
- J. Circuits Syst. Comput.
- DATE
- Microelectron. Reliab.
- DAC
- ASP-DAC
- ISQED
- APCCAS
- SoCC
- ISIE
- ASICON
- IAS
- ICCD
- GLOBECOM
- ACM Great Lakes Symposium on VLSI
- IEEE Trans. Smart Grid
- ISLPED
- I2MTC
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