DISTANCE BASED OUTLIER DETECTION
Experts
- Fabrizio Angiulli
- Arthur Zimek
- Charu C. Aggarwal
- Hiroyuki Kitagawa
- Leman Akoglu
- Yue Zhao
- Sanjay Chawla
- Zengyou He
- Lei Cao
- Shengchun Deng
- Erich Schubert
- Xiaofei Xu
- Luigi Palopoli
- Oussama Ghorbel
- Saihua Cai
- Michael Georgiopoulos
- Mohamed Abid
- Elke A. Rundensteiner
- Ruizhi Sun
- Daochen Zha
- Xiyang Hu
- Jerry Chun-Wei Lin
- Feng Jiang
- Christos Faloutsos
- Xia Hu
- Ira Assent
- Philip S. Yu
- Jiawei Han
- Yuefei Sui
- Shengrui Wang
- Nirvana Meratnia
- Zheng Li
- Aoying Zhou
- Yongjun Wang
- Sicong Li
- Paul J. M. Havinga
- Anna Koufakou
- George H. Chen
- Ricardo J. G. B. Campello
Venues
- CoRR
- IEEE Access
- KDD
- ICDM
- Expert Syst. Appl.
- Data Min. Knowl. Discov.
- IEEE Trans. Knowl. Data Eng.
- Neurocomputing
- IJCNN
- ICDE
- Knowl. Based Syst.
- SDM
- IEEE BigData
- Inf. Sci.
- Comput. Stat. Data Anal.
- Sensors
- Stat. Methods Appl.
- CIKM
- Pattern Recognit. Lett.
- ICDM Workshops
- Multim. Tools Appl.
- Pattern Recognit.
- AAAI
- Knowl. Inf. Syst.
- Proc. VLDB Endow.
- Commun. Stat. Simul. Comput.
- PAKDD
- Bioinform.
- SEBD
- IJCAI
- Neural Comput. Appl.
- J. Intell. Fuzzy Syst.
- BMC Bioinform.
- ESANN
- PAKDD (2)
- ICPR
- Eng. Appl. Artif. Intell.
- Intell. Data Anal.
- ICNC-FSKD
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