DISCRIMINANT FEATURES
Experts
- Chun-Na Li
- Feiping Nie
- Yuan-Hai Shao
- Chris H. Q. Ding
- Ioannis Pitas
- Heng Huang
- Anastasios Tefas
- Edward R. Dougherty
- Jian Yang
- Xuelong Li
- David Zhang
- Shuai Zheng
- Delin Chu
- Kuldip K. Paliwal
- Alok Sharma
- Pong Chi Yuen
- Yan-Ru Guo
- Marco Loog
- Dao-Qing Dai
- Amin Zollanvari
- Qiuqi Ruan
- Mayer Aladjem
- Jing-Yu Yang
- Lukás Burget
- Jieping Ye
- Nai-Yang Deng
- Dacheng Tao
- Lan Bai
- Zhong Jin
- Jingyu Yang
- Tommy W. S. Chow
- Wen-Sheng Chen
- Haesun Park
- Ning Ye
- Haihong Zhang
- Yong Xu
- Ching Y. Suen
- Hermann Ney
- Jianhua Zhao
Venues
- CoRR
- Pattern Recognit.
- ICASSP
- Pattern Recognit. Lett.
- ICIP
- Neurocomputing
- INTERSPEECH
- ICPR
- ICPR (2)
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- IEEE Trans. Neural Networks Learn. Syst.
- Expert Syst. Appl.
- ICML
- IEICE Trans. Inf. Syst.
- Comput. Stat. Data Anal.
- ICASSP (2)
- Neural Comput. Appl.
- IEEE Trans. Knowl. Data Eng.
- IEEE Trans. Image Process.
- IJCNN
- Int. J. Pattern Recognit. Artif. Intell.
- EMBC
- J. Multivar. Anal.
- IEEE Access
- Neural Networks
- Appl. Soft Comput.
- CAIP
- CVPR
- Appl. Intell.
- Eng. Appl. Artif. Intell.
- ICDAR
- J. Classif.
- NIPS
- FG
- Sensors
- AAAI
- ACM Trans. Knowl. Discov. Data
- SIAM J. Sci. Comput.
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