DETECTING OUTLIERS
Experts
- Arthur Zimek
- Fabrizio Angiulli
- Leman Akoglu
- Charu C. Aggarwal
- Yue Zhao
- Saihua Cai
- Hiroyuki Kitagawa
- Luigi Palopoli
- Lei Cao
- Erich Schubert
- Longbing Cao
- Feng Jiang
- Oussama Ghorbel
- Ruizhi Sun
- Michael Georgiopoulos
- Mohamed Abid
- Sanjay Chawla
- Klemens Böhm
- Elke A. Rundensteiner
- Daochen Zha
- Jörg Sander
- Hans-Peter Kriegel
- Xia Hu
- Bin Yang
- Tung Kieu
- Christian S. Jensen
- Ira Assent
- Philip S. Yu
- Jiawei Han
- Milos Hauskrecht
- Yuefei Sui
- Ricardo J. G. B. Campello
- Guansong Pang
- Chang-Tien Lu
- Sicong Li
- Manish Gupta
- Xiyang Hu
- Ji Zhang
- Zheng Li
Venues
- CoRR
- IEEE Access
- Expert Syst. Appl.
- KDD
- ICDM
- Inf. Sci.
- IJCNN
- SDM
- Sensors
- ICDE
- IEEE BigData
- Pattern Recognit. Lett.
- Comput. Stat. Data Anal.
- Stat. Methods Appl.
- ICDM Workshops
- AAAI
- IEEE Trans. Knowl. Data Eng.
- Knowl. Inf. Syst.
- Knowl. Based Syst.
- CIKM
- Commun. Stat. Simul. Comput.
- Intell. Data Anal.
- BMC Bioinform.
- Pattern Recognit.
- Neurocomputing
- J. Intell. Fuzzy Syst.
- Data Min. Knowl. Discov.
- IJCAI
- SIGMOD Conference
- Neural Comput. Appl.
- Multim. Tools Appl.
- Appl. Soft Comput.
- PAKDD (2)
- Appl. Intell.
- ISDA
- ICMLA
- ICASSP
- ITC
- WAIM
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