COMPONENT LABELING
Experts
- Wei Lu
- Susanne E. Hambrusch
- Chin-Chen Chang
- Alina N. Moga
- Yuileong Yeung
- Tetsuo Asano
- Debranjan Sarkar
- Lidija Comic
- Hongchi Shi
- Moncef Gabbouj
- L. Snyder
- Robert Cypher
- Kuo-Liang Chung
- Jorge L. C. Sanz
- Péter Balázs
- Dan Schonfeld
- Pasi Fränti
- Bingwen Feng
- Kálmán Palágyi
- Yingjie Xue
- Yuyan Chao
- Gabriella Sanniti di Baja
- Bin Yao
- Lifeng He
- Eugene I. Ageenko
- Kuo-Chin Fan
- Hae Yong Kim
- Paola Magillo
- Gerhard X. Ritter
- Prabir Bhattacharya
- Frank K. H. A. Dehne
- Hiroshi Umeo
- Kai Qian
- S. Subramaniam
- Daming Feng
- Walter G. Kropatsch
- Nagarajan Ranganathan
- Russ Miller
- Riccardo Poli
Venues
- CoRR
- Systems and Computers in Japan
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- J. Parallel Distributed Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- J. Vis. Commun. Image Represent.
- ICIP
- ICASSP
- J. Math. Imaging Vis.
- ICDAR
- MVA
- Image Vis. Comput.
- CVGIP Graph. Model. Image Process.
- DGCI
- ICPR
- IWCIA
- Comput. Graph.
- Comput. Vis. Graph. Image Process.
- IPDPS
- J. Supercomput.
- IWDW
- Softw. Pract. Exp.
- ICPR (3)
- ICPP (3)
- ICPR (2)
- CAIP
- IEEE Trans. Computers
- Parallel Comput.
- SPDP
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- ISVC (2)
- ICIP (2)
- Comput. Aided Des.
- IET Image Process.
- ICCV Workshops
- Visual Information Processing
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