COMPONENT LABELING
Experts
- Wei Lu
- Susanne E. Hambrusch
- Chin-Chen Chang
- Alina N. Moga
- Péter Balázs
- Lidija Comic
- Hongchi Shi
- Robert Cypher
- Tetsuo Asano
- Debranjan Sarkar
- Yuileong Yeung
- L. Snyder
- Kuo-Liang Chung
- Jorge L. C. Sanz
- Dan Schonfeld
- Moncef Gabbouj
- Kuo-Chin Fan
- Yingjie Xue
- Gabriella Sanniti di Baja
- Hae Yong Kim
- Eugene I. Ageenko
- Yuyan Chao
- Pasi Fränti
- Bin Yao
- Lifeng He
- Paola Magillo
- Kálmán Palágyi
- Bingwen Feng
- Gerhard X. Ritter
- Phaisit Chewputtanagul
- Lin Zhang
- Benedek Nagy
- Diane Oyen
- Joseph F. JáJá
- Liping Yang
- Nikos P. Chrisochoides
- Adnan A. Y. Mustafa
- Walter G. Kropatsch
- Songpol Ongwattanakul
Venues
- CoRR
- Systems and Computers in Japan
- Pattern Recognit.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- J. Parallel Distributed Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- ICIP
- ICDAR
- J. Math. Imaging Vis.
- J. Vis. Commun. Image Represent.
- ICASSP
- MVA
- DGCI
- Image Vis. Comput.
- CVGIP Graph. Model. Image Process.
- ICPR
- Softw. Pract. Exp.
- IWDW
- ICPR (3)
- J. Supercomput.
- Comput. Vis. Graph. Image Process.
- IWCIA
- CAIP
- ICPP (3)
- Comput. Graph.
- IEEE Trans. Computers
- Parallel Comput.
- ICPR (2)
- IPDPS
- ICSIPA
- EUSIPCO
- IET Image Process.
- Signal Process.
- IEEE Trans. Inf. Theory
- Comput. Vis. Image Underst.
- ICIAP (2)
- ICIP (2)
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