COMBINATION OF MULTIPLE CLASSIFIERS
Experts
- Josef Kittler
- Ventzeslav Valev
- Hee-Joong Kang
- Saso Dzeroski
- Yaxin Bi
- Yea S. Huang
- Robert P. W. Duin
- Ching Y. Suen
- Ludmila I. Kuncheva
- Asim Roy
- Anil K. Jain
- Iván Darío López
- Lei Chen
- Hakan Altinçay
- Vadim Mottl
- Pavel A. Turkov
- Jie Sun
- Juan Carlos Corrales
- Kevin W. Bowyer
- Bogdan Gabrys
- Mohamed S. Kamel
- Liying Yang
- Hui Li
- Paul Augustine Ejegwa
- Luiz S. Oliveira
- Robert Sabourin
- Mohamad Hatef
- Daniel Neagu
- Kevin S. Woods
- José Aguilar
- Seong-Whan Lee
- W. Philip Kegelmeyer
- Seiichi Ozawa
- Olga Krasotkina
- Asai Asaithambi
- Bernard Zenko
- Manikanta Durga Srinivas Anisetty
- Florian Boudin
- Hadi Sadoghi Yazdi
Venues
- Pattern Recognit.
- Multiple Classifier Systems
- Expert Syst. Appl.
- ICPR
- ICDAR
- Int. J. Pattern Recognit. Artif. Intell.
- MLDM
- IEEE Trans. Pattern Anal. Mach. Intell.
- Inf. Sci.
- Pattern Anal. Appl.
- Pattern Recognit. Lett.
- Appl. Soft Comput.
- ICMLA
- Int. Arab J. Inf. Technol.
- IEEE Access
- CoRR
- ICONIP (2)
- Neurocomputing
- CVPR
- Remote. Sens.
- ICIAP
- SMC
- Mach. Learn.
- MICAI (2)
- ICCS
- IWFHR
- SPECOM
- Neural Networks
- ACPR
- Int. J. Approx. Reason.
- Artif. Intell.
- IMIS
- ICPRAM (1)
- HIS
- NER
- ECML/PKDD (1)
- Patterns
- ACM Southeast Regional Conference
- NCM (2)
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