CLOSED SEQUENTIAL PATTERNS
Experts
- Jiawei Han
- Maguelonne Teisseire
- Tzung-Pei Hong
- Ming-Yen Lin
- Toon Calders
- Chedy Raïssi
- Lei Duan
- Chowdhury Farhan Ahmed
- Guozhu Dong
- Pascal Poncelet
- Xiangjun Dong
- Tengjiao Wang
- Dongqing Yang
- Jing Lu
- Philippe Fournier-Viger
- Lei Chang
- Sue-Chen Hsueh
- Marc Plantevit
- Unil Yun
- Carson Kai-Sang Leung
- Anne Laurent
- Eric Hsueh-Chan Lu
- Dmitriy Fradkin
- Guimei Liu
- Jian Pei
- Ying-Ho Liu
- Vincent S. Tseng
- Ching-Yao Wang
- Zhao Li
- Shilong Ma
- Weimin Ouyang
- Xifeng Yan
- Malcolm Keech
- Christie I. Ezeife
- Suh-Yin Lee
- Weiru Chen
- Tiantian Xu
- Changjie Tang
- Hoang Thanh Lam
Venues
- ICDM
- CoRR
- DaWaK
- SDM
- Intell. Data Anal.
- Knowl. Based Syst.
- J. Inf. Sci. Eng.
- Data Min. Knowl. Discov.
- Inf. Sci.
- IEEE BigData
- PAKDD
- Data Knowl. Eng.
- ADMA
- Expert Syst. Appl.
- FSKD (2)
- DMIN
- IEEE Trans. Knowl. Data Eng.
- Knowl. Inf. Syst.
- Int. J. Pattern Recognit. Artif. Intell.
- DASFAA (1)
- Int. J. Geogr. Inf. Sci.
- ADMA (1)
- FSKD
- DASFAA
- KES (3)
- IMCOM
- Appl. Intell.
- ACM Trans. Knowl. Discov. Data
- IEEE Access
- J. Softw.
- J. Comput.
- WAIM
- CIKM
- Eng. Appl. Artif. Intell.
- ECML/PKDD (1)
- KES
- MLDM
- ECAI
- Int. J. Data Warehous. Min.
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