BOOSTED CLASSIFIERS
Experts
- Xilin Chen
- Shiguang Shan
- Chunhua Shen
- Nuno Vasconcelos
- Peng Wang
- Junjie Yan
- Zhaowei Cai
- Stan Z. Li
- Rodrigo Verschae
- Javier Ruiz-del-Solar
- Jiri Matas
- Wen Gao
- Wankou Yang
- Sakrapee Paisitkriangkrai
- Jian Zhang
- Jinwoo Shin
- Jinqiao Wang
- Dacheng Tao
- Haoyu Ren
- James M. Rehg
- Gang Hua
- Zhen Lei
- Shengye Yan
- Modesto Castrillón Santana
- David J. Miller
- Johel Mitéran
- Vishal M. Patel
- Philip H. S. Torr
- Peihua Li
- Shuai Yi
- Zhe Lin
- Robert E. Schapire
- Visvanathan Ramesh
- Jean-Philippe Thiran
- Hong Chang
- Ze-Nian Li
- Wanli Ouyang
- Liang Lin
- Blaise Hanczar
Venues
- CoRR
- CVPR
- ICIP
- Pattern Recognit. Lett.
- Multim. Tools Appl.
- Sensors
- ICASSP
- ICPR
- IEEE Access
- ICME
- FG
- AAAI
- Pattern Recognit.
- CVPR Workshops
- WACV
- SMC
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- IJCNN
- Int. J. Pattern Recognit. Artif. Intell.
- ICML
- Knowl. Based Syst.
- Image Vis. Comput.
- AVBPA
- BMVC
- Neurocomputing
- IPCV
- IEEE Signal Process. Lett.
- ICPRAM
- AIPR
- SIU
- EuroGP
- SITIS
- IEEE Trans. Geosci. Remote. Sens.
- Wirel. Pers. Commun.
- Signal Image Video Process.
- AVSS
- ACCV (2)
- Int. J. Comput. Vis.
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