BINARY PATTERNS
Experts
- Matti Pietikäinen
- Soumendu Chakraborty
- Satish Kumar Singh
- Pavan Chakraborty
- Adel Hafiane
- Shiguang Shan
- Wen Gao
- Wei Lu
- Xilin Chen
- Debotosh Bhattacharjee
- Guoying Zhao
- Robert Mercas
- Yong Man Ro
- Shekhar Karanwal
- Ali Behloul
- Safia Boudra
- Itheri Yahiaoui
- Youssef El Merabet
- Yuileong Yeung
- Yilmaz Kaya
- Qingmin Liao
- Kevin J. Parker
- Wenchao Zhang
- Thanh Phuong Nguyen
- Alice Caplier
- Ngoc-Son Vu
- Weifeng Li
- Hiranmoy Roy
- Zhenan Sun
- Jae Young Choi
- Türker Tuncer
- Guna Seetharaman
- Josef Kittler
- John C. Kieffer
- Francine Blanchet-Sadri
- David Zhang
- Cheng-Yaw Low
- Juha Ylioinas
- Andrew Beng Jin Teoh
Venues
- CoRR
- Multim. Tools Appl.
- ICIP
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- ICPR
- Pattern Recognit.
- IEEE Access
- ICASSP
- Neurocomputing
- IEEE Trans. Inf. Theory
- IEEE Trans. Circuits Syst. Video Technol.
- SIBGRAPI
- TRECVID
- J. Vis. Commun. Image Represent.
- ICME
- Pattern Anal. Appl.
- IEEE Trans. Inf. Forensics Secur.
- J. Electronic Imaging
- Image Vis. Comput.
- CVPR
- CCBR
- IEEE Trans. Commun.
- Expert Syst. Appl.
- Sensors
- EUSIPCO
- Systems and Computers in Japan
- Int. J. Pattern Recognit. Artif. Intell.
- WACV
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Signal Process. Lett.
- Digit. Signal Process.
- ACCV Workshops (1)
- PIMRC
- IScIDE
- CAIP
- J. Imaging
- Acta Informatica
- IEEE Trans. Geosci. Remote. Sens.
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