BINARY AND GRAY SCALE
Experts
- Péter Balázs
- Dan Schonfeld
- Edward R. Dougherty
- Frank Y. Shih
- Pasi Fränti
- T. Yung Kong
- Peer Stelldinger
- Ullrich Köthe
- John Goutsias
- Kuo-Liang Chung
- Robert M. Haralick
- Wei Lu
- Humberto Sossa
- Eugene I. Ageenko
- Yuileong Yeung
- Keiichi Abe
- Debranjan Sarkar
- Yingjie Xue
- Chyi-Jou Gau
- Chin-Chen Chang
- Cyril Höschl IV
- Aris M. Ouksel
- Tomás Suk
- Javier Vidal
- Keita Takahashi
- S. Sitharama Iyengar
- Michel Jourlin
- Henk J. A. M. Heijmans
- Mohammed Charif-Chefchaouni
- Satoshi Suzuki
- Ronald W. Schafer
- Tapas Kanungo
- Vito Di Gesù
- Jun Liu
- Fumitaka Kimura
- Bernard De Baets
- Harry Wechsler
- Theo Pavlidis
- Takahiko Horiuchi
Venues
- IEEE Trans. Image Process.
- Pattern Recognit.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- Multim. Tools Appl.
- DGCI
- J. Math. Imaging Vis.
- ICDAR
- ICASSP
- ICPR (3)
- J. Vis. Commun. Image Represent.
- MVA
- ICIP
- Int. J. Pattern Recognit. Artif. Intell.
- Systems and Computers in Japan
- CVGIP Graph. Model. Image Process.
- Comput. Vis. Image Underst.
- Comput. Graph.
- IWCIA
- CAIP
- J. Electronic Imaging
- Real Time Imaging
- ICIC (1)
- Image Vis. Comput.
- IIH-MSP
- CIST
- Image Processing: Algorithms and Systems
- ACIVS
- ISMM
- ISVC (2)
- IWDW
- Comput. Vis. Graph. Image Process.
- ICPR
- ICIP (1)
- IEEE Trans. Circuits Syst. Video Technol.
- Softw. Pract. Exp.
- Int. J. Imaging Syst. Technol.
- ICIP (2)
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