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Overview
- high volume
- cmos image sensor
- early diagnosis
- imperative programs
- cyber defense
Publications
An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology.
IRPS
In-Depth Analysis of One Selector-One Resistor Crossbar Array for Its Writing and Reading Operations for Hardware Neural Network with Finite Wire Resistance.
Adv. Intell. Syst.
Cyber Attack Scenarios in Cooperative Automated Driving.
BWCCA
ProcAnalyzer: Effective Code Analyzer for Tuning Imperative Programs in SAP HANA.
SIGMOD Conference
Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology.
IRPS
Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology.
IRPS