Login / Signup

Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies.

Semiu A. OlowogemoHao QiuBor-Tyng LinWilliam H. RobinsonDaniel B. Limbrick
Published in: DFT (2022)
Keyphrases
  • quantitative analysis
  • real time
  • neural network
  • information systems
  • image analysis
  • event detection
  • risk assessment
  • decision making
  • wireless sensor networks