Login / Signup
Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies.
Semiu A. Olowogemo
Hao Qiu
Bor-Tyng Lin
William H. Robinson
Daniel B. Limbrick
Published in:
DFT (2022)
Keyphrases
</>
quantitative analysis
real time
neural network
information systems
image analysis
event detection
risk assessment
decision making
wireless sensor networks