Mismatch effects explained by the spectral model [MOS devices].

Jürgen Oehm Ulrich Grünebaum Klaus Schumacher

Published in: ICECS (1999)

Keyphrases

probabilistic model
high level
linear model
theoretical framework
autoregressive
neural network
multiscale
theoretical analysis
computational model
mathematical model
experimental data
conceptual model
simulation model
formal model