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Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy.
Peng Luan
Yibang Wang
Wei Zhao
Chen Liu
Faguo Liang
Aihua Wu
Jing Du
Published in:
IEEE Trans. Instrum. Meas. (2020)
Keyphrases
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monte carlo
markov chain
monte carlo methods
error analysis
computational cost
temporal difference
variance reduction
search algorithm
particle filter
simulation study
importance sampling
matrix inversion
markovian decision
camera calibration
confidence intervals