New automatic defect classification algorithm based on a classification-after-segmentation framework.
Sang-Hak LeeHyung Il KooNam Ik ChoPublished in: J. Electronic Imaging (2010)
Keyphrases
- classification algorithm
- accurate classification
- classification method
- document classification
- support vector machine
- knn
- training phase
- hierarchical classification
- classification rules
- k nearest neighbor
- training set
- naive bayes
- statistical classification
- input features
- learning algorithm
- machine learning
- discriminant functions
- neural network
- class labels
- level set
- classification accuracy
- text classification
- concept drift
- probabilistic model
- feature extraction
- image segmentation
- decision trees
- clustering algorithm
- computer vision
- database