Reliability investigation of light-emitting diodes via low frequency noise characteristics.
Sandra PralgauskaiteVilius PalenskisJonas MatukasJustinas GlemzaGrigorij MuliukBronius SaulysAugustinas TrinkunasPublished in: Microelectron. Reliab. (2015)
Keyphrases
- low frequency
- light emitting diodes
- high frequency
- frequency domain
- light emitting
- wavelet transform
- wavelet analysis
- discrete wavelet transform
- subband
- frequency band
- video camera
- wavelet coefficients
- original images
- high frequency components
- electromagnetic fields
- high resolution
- fusion rules
- multiscale
- low and high frequency
- image processing
- dct coefficients
- optical flow
- feature space
- face recognition